HISTORY OF QUANTITATIVE ELECTRON PROBE MICROANALYSIS p. C2-3 K.F.J. Heinrich DOI: https://doi.org/10.1051/jphyscol:1984201 AbstractPDF (239.8 KB)
EVALUATION OF CORRECTION PROCEDURES FOR QUANTITATIVE LIGHT ELEMENT EPMA p. C2-9 I.B. Borovskii, A.I. Kozlenkov and T.A. Bolochova DOI: https://doi.org/10.1051/jphyscol:1984202 AbstractPDF (259.0 KB)
A MONTE CARLO SIMULATION APPROACH TO THIN FILM ELECTRON MICROPROBE ANALYSIS BASED ON THE USE OF MOTT SCATTERING CROSS-SECTIONS p. C2-13 K. Murata, S. Cvikevich and J.D. Kuptsis DOI: https://doi.org/10.1051/jphyscol:1984203 AbstractPDF (208.7 KB)
EXTENSION DES POSSIBILITÉS QUANTITATIVES DE LAMICROANALYSE PAR UNE FORMULATION NOUVELLE DES EFFETS DE MATRICE p. C2-17 J.L. Pouchou and F. Pichoir DOI: https://doi.org/10.1051/jphyscol:1984204 AbstractPDF (175.9 KB)
AN IMPROVED ABSORPTION CORRECTION FOR QUANTITATIVE ANALYSIS p. C2-21 G. Love, D.A. Sewell and V.D. Scott DOI: https://doi.org/10.1051/jphyscol:1984205 AbstractPDF (155.8 KB)
MICROANALYSE EN INCIDENCE RASANTE p. C2-25 C. Landron and K. Raouadi DOI: https://doi.org/10.1051/jphyscol:1984206 AbstractPDF (147.5 KB)
THICKNESS DETERMINATION OF Al FILMS ON Si BY A MONTE CARLO CODE INCLUDING A SECONDARY FLUORESCENCE CORRECTION p. C2-29 A. Armigliato, A. Desalvo, A . Garulli and R. Rosa DOI: https://doi.org/10.1051/jphyscol:1984207 AbstractPDF (151.4 KB)
X-RAY STUDIES RELATED TO COATING THICKNESS MEASUREMENTS p. C2-33 D.A. Sewell, I.D. Hall, G. Love, J.P. Partridge and V.D. Scott DOI: https://doi.org/10.1051/jphyscol:1984208 AbstractPDF (150.2 KB)
AN EXPERIMENTAL TEST OF A ZAF CORRECTION PROGRAM FOR TILTED SPECIMENS AND ENERGY DISPERSIVE SPECTROMETRY p. C2-37 B. Lödding and L. Reimer DOI: https://doi.org/10.1051/jphyscol:1984209 AbstractPDF (124.3 KB)
AN EVALUATION OF X-RAY LOSS DUE TO ELECTRON BACKSCATTER p. C2-41 R.L. Myklebust DOI: https://doi.org/10.1051/jphyscol:1984210 AbstractPDF (83.50 KB)
A CORRECTION PROCEDURE FOR CHARACTERISTIC FLUORESCENCE IN MICROPROBE ANALYSIS NEAR PHASE BOUNDARIES p. C2-43 G.F. Bastin, F.J.J. van Loo, P.J.C. Vosters and J.W.G.A. Vrolijk DOI: https://doi.org/10.1051/jphyscol:1984211 AbstractPDF (157.3 KB)
ANALYSE D'ÉCHANTILLONS STRATIFIÉS À LA MICROSONDE ÉLECTRONIQUE p. C2-47 J.L. Pouchou and F. Pichoir DOI: https://doi.org/10.1051/jphyscol:1984212 AbstractPDF (187.8 KB)
QUANTUM-MECHANICAL BASED VERSION OF X-RAY CHARACTERISTIC ATTENUATION COEFFICIENTS p. C2-51 O.S. Marenkov DOI: https://doi.org/10.1051/jphyscol:1984213 AbstractPDF (89.81 KB)
EVALUATION DES EFFETS DE DIFFRACTION SUR LES SIGNAUX OBTENUS À PARTIR DES MICROSONDES ÉLECTRONIQUES p. C2-53 J. Henoc, P. Henoc, F. Maurice and K. Raouadi DOI: https://doi.org/10.1051/jphyscol:1984214 AbstractPDF (170.2 KB)
X-RAY MICROSCOPY AND MICROANALYSIS : INTRODUCTORY SURVEY p. C2-59 V.E. Cosslett DOI: https://doi.org/10.1051/jphyscol:1984215 AbstractPDF (694.5 KB)
METALLIC MULTILAYERS MIRRORS : NEW POSSIBILITIES FOR SOFT X-RAY IMAGING AND SPECTROSCOPY p. C2-65 P. Dhez DOI: https://doi.org/10.1051/jphyscol:1984216 AbstractPDF (158.9 KB)
ADVANCES IN X-RAY OPTICS AT THE NATIONAL PHYSICAL LABORATORY p. C2-69 A. Franks DOI: https://doi.org/10.1051/jphyscol:1984217 AbstractPDF (484.4 KB)
PHOTOELECTRON X-RAY MICROSCOPY p. C2-73 F. Polack and S. Lowenthal DOI: https://doi.org/10.1051/jphyscol:1984218 AbstractPDF (486.0 KB)
HIGH RESOLUTION X-RAY MICROSCOPY WITH ZONE PLATE MICROSCOPES p. C2-77 G. Schmahl, D. Rudolph and B. Niemann DOI: https://doi.org/10.1051/jphyscol:1984219 AbstractPDF (1.251 MB)
LARGE FIELD X-RAY ABSORPTION MICRO-ANALYSIS NEAR AN ABSORPTION EDGE BY IMAGE PROCESSING p. C2-83 E. Bigler and F. Polack DOI: https://doi.org/10.1051/jphyscol:1984220 AbstractPDF (676.4 KB)
AN IMAGING SOFT X-RAY MICROSCOPE AT THE DARESBURY SYNCHROTRON RADIATION SOURCE p. C2-87 M.T. Browne, R.E. Burge, P. Charalambous, P.J. Duke, A. Freake, A. McDowell, A. Michette, G. Nave, R. Rosser, M.J. Simpson and W. Smith DOI: https://doi.org/10.1051/jphyscol:1984221 AbstractPDF (86.67 KB)
A NEW LITHOGRAPHIC TECHNIQUE FOR THE MANUFACTURE OF HIGH RESOLUTION ZONE PLATES FOR SOFT X-RAYS p. C2-89 M.T. Browne, P. Charalambous, R.E. Burge, P.J. Duke, A.G. Michette and M.J. Simpson DOI: https://doi.org/10.1051/jphyscol:1984222 AbstractPDF (1.519 MB)
THE EFFECTS OF MANUFACTURING INACCURACIES ON THE IMAGING PROPERTIES OF ZONE PLATES p. C2-93 M.J. Simpson, M.T. Browne, R.E. Burge, P. Charalambous, P.J. Duke and A.G. Michette DOI: https://doi.org/10.1051/jphyscol:1984223 AbstractPDF (159.1 KB)
THREE DIMENSIONAL IMAGING IN SCANNING SOFT X-RAY MICROSCOPY p. C2-97 L.M. Cheng and A.G. Michette DOI: https://doi.org/10.1051/jphyscol:1984224 AbstractPDF (1.178 MB)
COMPARISON OF SECONDARY ION MASS SPECTROMETRY (SIMS) WITH ELECTRON MICROPROBE ANALYSIS (EPMA) AND OTHER THIN FILM ANALYTICAL METHODS p. C2-103 H.W. Werner and A.P. von Rosenstiel DOI: https://doi.org/10.1051/jphyscol:1984225 AbstractPDF (822.9 KB)
DEPTH RESOLUTION IN ION SPUTTERING - AN ASPECT OF QUANTITATIVEMICROANALYSIS p. C2-115 J. Giber, D. Marton and J. László DOI: https://doi.org/10.1051/jphyscol:1984226 AbstractPDF (122.6 KB)
APPLICATION OF CESIUM PRIMARY BEAM TO THE CHARACTERIZATION OF III.V SEMICONDUCTORS BY SIMS p. C2-119 M. Gauneau, R. Chaplain and A. Rupert DOI: https://doi.org/10.1051/jphyscol:1984227 AbstractPDF (218.4 KB)
MÉTHODE D'ANALYSE FONDÉE SUR L'IONISATION PAR ÉLECTRONS DES PRODUITS DE PULVÉRISATION THERMALISÉS p. C2-125 G. Blaise, R. Castaing and R. Quettier DOI: https://doi.org/10.1051/jphyscol:1984228 AbstractPDF (778.4 KB)
MÉCANISME DE FORMATION D'IONS POLYATOMIQUES SECONDAIRES. APPLICATIONS AUX IONS Cu+2 ET Cu+3 p. C2-129 P. Joyes DOI: https://doi.org/10.1051/jphyscol:1984229 AbstractPDF (131.9 KB)
SHADOWING EFFECTS OBSERVED IN SLOW IONS BACKSCATTERING ON A METALLIC CRYSTAL : EXPERIMENTS AND SIMULATIONS p. C2-133 C. Coudray DOI: https://doi.org/10.1051/jphyscol:1984230 AbstractPDF (200.5 KB)
ASPECTS ANALYTIQUES DES ÉMISSIONS D'IONS SECONDAIRES ET D'ÉLECTRONS AUGER PAR LES ALLIAGES Fe-Al ET Cu-Al BOMBARDÉS EN ULTRA-VIDE PAR DES IONS Ar+ p. C2-139 P. Viaris de Lesegno, R.-L. Inglebert and J.-F. Hennequin DOI: https://doi.org/10.1051/jphyscol:1984231 AbstractPDF (200.1 KB)
SUPPRESSION OF MOLECULAR IONS IN SECONDARY ION MASS SPECTRA p. C2-143 N.S. McIntyre, W.J. Chauvin, J.B. Metson and G.M. Bancroft DOI: https://doi.org/10.1051/jphyscol:1984232 AbstractPDF (162.5 KB)
INSTRUMENTATION, ELECTRON OPTICS AND X-RAY SPECTROSCOPY p. C2-149 T. Mulvey DOI: https://doi.org/10.1051/jphyscol:1984233 AbstractPDF (306.9 KB)
ENERGY SPREAD MEASUREMENT IN FIELD ELECTRON MICROSCOPY p. C2-155 M. Troyon and Jiang Jia-Ying DOI: https://doi.org/10.1051/jphyscol:1984234 AbstractPDF (93.36 KB)
X-RAY GRAZING INCIDENCE OPTICS FOR THE ELECTRON MICROPROBE p. C2-157 A.I. Kozlenkov and A.I. Shulgin DOI: https://doi.org/10.1051/jphyscol:1984235 AbstractPDF (210.3 KB)
MATHEMATICAL SIMULATION OF X-RAY OPTICAL SYSTEMS USING MONTE CARLO METHOD p. C2-161 V.P. Nikolaev, R.I. Plotnikov, O.S. Marenkov and T.V. Singarieva DOI: https://doi.org/10.1051/jphyscol:1984236 AbstractPDF (933.2 KB)
CHROMATIC CHANGE IN MAGNIFICATION AND IN ROTATION FOR MAGNETIC LENSES p. C2-165 A.A. Alshwaikh DOI: https://doi.org/10.1051/jphyscol:1984237 AbstractPDF (169.1 KB)
CARACTÉRISTIQUES DU "MEBIS" : MICROSCOPE À BALAYAGE FONCTIONNANT IN SITU p. C2-169 B. Jouffrey, J. Trinquier and J.L. Franceschi DOI: https://doi.org/10.1051/jphyscol:1984238 AbstractPDF (1.405 MB)
ÉTUDE, AU PREMIER ORDRE, D'UN SYSTÈME DISPERSIF, MAGNÉTIQUE, SYMÉTRIQUE, DE TYPE ALPHA p. C2-171 J.Ph. Perez, J. Sirven, A. Seguela and J.C. Lacaze DOI: https://doi.org/10.1051/jphyscol:1984239 AbstractPDF (121.7 KB)
ACCURACY, REPRODUCIBILITY AND SCOPE FOR X-RAY MICROANALYSIS WITH Si(Li) DETECTORS p. C2-175 P.J. Statham DOI: https://doi.org/10.1051/jphyscol:1984240 AbstractPDF (239.1 KB)
QUANTITATIVE LIGHT ELEMENT ANALYSIS USING EDS p. C2-181 D.J. Bloomfield, G. Love and V.D. Scott DOI: https://doi.org/10.1051/jphyscol:1984241 AbstractPDF (180.1 KB)
BORON ANALYSIS AND MAPPING WITH A WINDOWLESS ENERGY DISPERSIVE DETECTOR p. C2-185 A.O. Sandborg and M.E. Whitehead DOI: https://doi.org/10.1051/jphyscol:1984242 AbstractPDF (690.5 KB)
THE INTENSITY ENHANCEMENT OF X-RAYS REFLECTED BY AN ANALYZING CRYSTAL MADE OF A THIN FILM p. C2-189 T.S. Uragami DOI: https://doi.org/10.1051/jphyscol:1984243 AbstractPDF (584.2 KB)
PROCESSING INFORMATION FROM SCANNING INSTRUMENTS p. C2-195 P.W. Hawkes DOI: https://doi.org/10.1051/jphyscol:1984244 AbstractPDF (324.8 KB)
USE OF COLOR SCALES IN MICROANALYTICAL MAPS p. C2-201 K.F.J. Heinrich DOI: https://doi.org/10.1051/jphyscol:1984245 AbstractPDF (2.639 MB)
USE OF THE X-RAY MICROANALYSER AS AN IMAGE ANALYSER p. C2-211 M.P. Jones DOI: https://doi.org/10.1051/jphyscol:1984246 AbstractPDF (164.4 KB)
AN INTEGRATED SYSTEM FOR COLLECTION AND PROCESSING OF ANALYTICAL AND IMAGE DATA FROM THE SEM/STEM p. C2-215 J.J. McCarthy and J.P. Benson DOI: https://doi.org/10.1051/jphyscol:1984247 AbstractPDF (152.7 KB)
COMPUTER TECHNIQUES FOR TOPOGRAPHICAL ANALYSIS IN THE SCANNING ELECTRON MICROSCOPE p. C2-219 P. Atkin and K.C.A. Smith DOI: https://doi.org/10.1051/jphyscol:1984248 AbstractPDF (187.4 KB)
A USER DESIGNED SOFTWARE SYSTEM FOR ELECTRON MICROPROBES - BASIC PREMISES AND THE CONTROL PROGRAM+ p. C2-223 W.F. Chambers and J.H. Doyle DOI: https://doi.org/10.1051/jphyscol:1984249 AbstractPDF (761.4 KB)
A USER DESIGNED SOFTWARE SYSTEM FOR ELECTRON MICROPROBES - QUALITATIVE AND QUANTITATIVE TECHNIQUES+ p. C2-227 J.H. Doyle and W.F. Chambers DOI: https://doi.org/10.1051/jphyscol:1984250 AbstractPDF (178.7 KB)
EXTENDED SOFTWARE POSSIBILITIES IN X-RAY MICROANALYSIS p. C2-231 D. Grman and W.J. Muster DOI: https://doi.org/10.1051/jphyscol:1984251 AbstractPDF (131.2 KB)
CARACTÉRISATION DE LA MORPHOLOGIE DE CHARGES PAR MICROSCOPIE ÉLECTRONIQUE À TRANSMISSION, ANALYSE D'IMAGES, ET TRAITEMENT DES DONNÉES p. C2-235 B. Brachon, Y. Chevallier, B. Gariazzo, J. Marnat, M. Thévenard and P. Lamy DOI: https://doi.org/10.1051/jphyscol:1984252 AbstractPDF (106.6 KB)
ELECTRON DIFFRACTION ANALYSIS p. C2-239 M.E. Whitehead and V. Balmer DOI: https://doi.org/10.1051/jphyscol:1984253 AbstractPDF (428.3 KB)
NUCLEAR MICROPROBE ANALYSIS AT KARLSRUHE p. C2-245 D. Heck DOI: https://doi.org/10.1051/jphyscol:1984254 AbstractPDF (994.1 KB)
LASER RAMAN MICROPROBING TECHNIQUES p. C2-249 P. Dhamelincourt, J. Barbillat and M. Delhaye DOI: https://doi.org/10.1051/jphyscol:1984255 AbstractPDF (269.5 KB)
LE MICRODIL 28 : MICROSONDE RAMAN À DÉTECTION MULTICANALE p. C2-255 J. Barbillat, P. Dhamelincourt and M. Delhaye DOI: https://doi.org/10.1051/jphyscol:1984256 AbstractPDF (79.84 KB)
MICROANALYSE PHYSICOCHIMIQUE SUPERFICIELLE DU POLYÉTHYLÈNE PAR SPECTROMÉTRIES VIBRATIONNELLES p. C2-257 D. Dothée, M. Camelot and C. Roques-Carmes DOI: https://doi.org/10.1051/jphyscol:1984257 AbstractPDF (155.4 KB)
LASER MICROPROBE MASS ANALYSIS DETECTION LIMITS AND LATERAL RESOLUTION p. C2-261 P. Wieser, R. Wurster and H. Seiler DOI: https://doi.org/10.1051/jphyscol:1984258 AbstractPDF (1017 KB)
QUANTITATIVE MICROANALYSIS OF SOLID SAMPLES WITH THE LASER PROBE MASS SPECTROMETRY II (L.P.M.S. II) p. C2-265 J.F. Eloy DOI: https://doi.org/10.1051/jphyscol:1984259 AbstractPDF (160.8 KB)
X-RAY PHOTOELECTRON MICROPROBE ANALYSIS AND RELATED TECHNIQUES p. C2-271 J. Cazaux, D. Gramari, D. Mouze, A.G. Nassiopoulos and J. Perrin DOI: https://doi.org/10.1051/jphyscol:1984260 AbstractPDF (1.123 MB)
SYNCHROTRON RADIATION PLUS PHOTODIODE ARRAY : EXAFS IN DISPERSIVE MODE FOR FAST MICROANALYSIS p. C2-275 E. Dartyge, A.M. Flank, A. Fontaine and A. Jucha DOI: https://doi.org/10.1051/jphyscol:1984261 AbstractPDF (79.46 KB)
1 keV X-RAY ABSORPTION SPECTROSCOPY OF BULK MATERIALS BY ELECTRON YIELD MEASUREMENT p. C2-279 J.M. Esteva and R.C. Karnatak DOI: https://doi.org/10.1051/jphyscol:1984262 AbstractPDF (76.32 KB)
X-RAY FLUORESCENCE ANALYSIS WITH MONOCHROMATIC X-RAYS p. C2-281 M. Kotera and D.B. Wittry DOI: https://doi.org/10.1051/jphyscol:1984263 AbstractPDF (119.5 KB)
MASS TRANSPORT AT THE LASERGLAZING OF METALS p. C2-285 I.B. Borovskii, D.D. Gorodskii and I.M. Sharafeev DOI: https://doi.org/10.1051/jphyscol:1984264 AbstractPDF (740.1 KB)
QUANTITATIVE SCANNING ELECTRON MICROSCOPY OF SURFACES p. C2-291 L. Reimer DOI: https://doi.org/10.1051/jphyscol:1984265 AbstractPDF (1.243 MB)
TOTAL RATE IMAGING WITH X-RAYS IN A SCANNING ELECTRON MICROSCOPE p. C2-297 P. Bernsen and L. Reimer DOI: https://doi.org/10.1051/jphyscol:1984266 AbstractPDF (505.5 KB)
ANALYTICAL LOW VOLTAGE SEM IN UHV FOR SOLID SURFACE p. C2-301 T. Ichinokawa, H. Ampo and S. Kinoshita DOI: https://doi.org/10.1051/jphyscol:1984267 AbstractPDF (2.344 MB)
CANON À ÉMISSION DE CHAMP POUR MICROANALYSE PAR SPECTROSCOPIE D'ÉLECTRONS AUGER p. C2-307 P. Morin and F. Simondet DOI: https://doi.org/10.1051/jphyscol:1984268 AbstractPDF (429.7 KB)
SCANNING AUGER MICROANALYSIS AT HIGH ENERGY PROBES p. C2-309 M. Tholomier, P. Morin, E. Vicario and N. Mubanga DOI: https://doi.org/10.1051/jphyscol:1984269 AbstractPDF (686.0 KB)
ANALYTICAL SEM FOR SURFACE SCIENCE p. C2-313 J.D. Geller and A. Mogami DOI: https://doi.org/10.1051/jphyscol:1984270 AbstractPDF (89.93 KB)
ON CHANGES OF SECONDARY EMISSION BY RESONANT TUNNELING VIA ADSORBATES p. C2-315 J. Halbritter DOI: https://doi.org/10.1051/jphyscol:1984271 AbstractPDF (139.3 KB)
THE EFFECTS OF SURFACE ROUGHNESS ON AUGER ELECTRON SPECTROSCOPY p. C2-319 D. Wehbi and C. Roques-Carmes DOI: https://doi.org/10.1051/jphyscol:1984272 AbstractPDF (445.5 KB)
MICROSCOPIC STUDY OF SURFACES BY AUGER TYPE EMISSION p. C2-323 C. Le Gressus DOI: https://doi.org/10.1051/jphyscol:1984273 AbstractPDF (1.039 MB)
ANALYSE QUANTITATIVE DES SURFACES PAR SPECTROMÉTRIE D'ÉLECTRONS p. C2-329 J.P. Duraud and C. Quenisset DOI: https://doi.org/10.1051/jphyscol:1984274 AbstractPDF (151.3 KB)
AMÉLIORATION PAR MICRO-ORDINATEUR DES ACQUISITIONS DE DONNÉES EN SPECTROMÉTRIE AUGER p. C2-333 T.T. Nguyen, C. Aubin and J.P. Henon DOI: https://doi.org/10.1051/jphyscol:1984275 AbstractPDF (132.6 KB)
THE EFFECTS OF X-RAY-INDUCED AUGER ELECTRONS IN AUGER MICROANALYSIS p. C2-337 J. Cazaux, D. Gramari, S. Moutou and A.G. Nassiopoulos DOI: https://doi.org/10.1051/jphyscol:1984276 AbstractPDF (178.3 KB)
THRESHOLD SPECTROSCOPIES AND THEIR PROSPECTS FOR MICROANALYSIS p. C2-341 J. Kirschner DOI: https://doi.org/10.1051/jphyscol:1984277 AbstractPDF (190.8 KB)
ÉMISSION ÉLECTRONIQUE ASSOCIÉE À L'INTERACTION MÉTASTABLE - SURFACE p. C2-345 C. Boiziau DOI: https://doi.org/10.1051/jphyscol:1984278 AbstractPDF (187.4 KB)
ÉTUDE PAR SPECTROSCOPIE DE DÉSEXCITATION D'ATOMES MÉTASTABLES D'UN FILM MINCE DE POLYACRYLONITRILE ÉLECTROPOLYMÉRISÉ p. C2-349 C. Lecayon and C. Reynaud DOI: https://doi.org/10.1051/jphyscol:1984279 AbstractPDF (174.8 KB)
STUDY OF CHEMICAL COMPOSITION AND ELECTRONIC STRUCTURE OF HIGH-MELTING COMPOUNDS OF ZIRCONIUM BY ELECTRONIC AES p. C2-353 I.A. Brytov, A.S. Wander and V.S. Neshpor DOI: https://doi.org/10.1051/jphyscol:1984280 AbstractPDF (207.1 KB)
REHEAT CRACKING STUDIES BY SCANNING AUGER AND ELECTRON MICROSCOPY INVESTIGATIONS p. C2-357 H. Horn and M. Weiss DOI: https://doi.org/10.1051/jphyscol:1984281 AbstractPDF (1.920 MB)
APPORT DE LA MICROSCOPIE ÉLECTRONIQUE SOUS INCIDENCE RASANTE À L'ÉTUDE DES SURFACES, APPLICATION AU LAITON 70/30 p. C2-361 E. Darque-Ceretti, M.Y. Perrin and F. Delamare DOI: https://doi.org/10.1051/jphyscol:1984282 AbstractPDF (632.5 KB)
ÉTUDE PAR MICROSCOPIE ÉLECTRONIQUE À BALAYAGE ET SPECTROMÉTRIE AUGER DE RUPTURES FRAGILES DU TUNGSTÈNE p. C2-367 Tran Huu Loi, E. Lhuire, J.P. Morniroli and M. Gantois DOI: https://doi.org/10.1051/jphyscol:1984283 AbstractPDF (1.058 MB)
LOW-ENERGY ELECTRON-INDUCED X-RAY SPECTROMETRY : A TECHNIQUE FOR SOLID SURFACE STUDIES p. C2-371 M.J. Romand, R. Bador, C. Desuzinges, M. Charbonnier, A. Roche and F. Gaillard DOI: https://doi.org/10.1051/jphyscol:1984284 AbstractPDF (986.6 KB)
DOSAGE DES ALCALINS À LA SURFACE DES VERRES SILICATÉS p. C2-375 M. Sfar, J.P. Lacharme, P. Lepeut and P. Champion DOI: https://doi.org/10.1051/jphyscol:1984285 AbstractPDF (198.8 KB)
STEM-EDS X-RAY MICROANALYSIS IN THIN METAL FOILS p. C2-381 P. Doig and P.E.J. Flewitt DOI: https://doi.org/10.1051/jphyscol:1984286 AbstractPDF (467.2 KB)
ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY WITH A THERMALLY STABILIZED FIELD EMISSION GUN p. C2-387 B. Thomas, J. Bourgeot, P. Chemelle and A. Rîbes DOI: https://doi.org/10.1051/jphyscol:1984287 AbstractPDF (85.97 KB)
THE PREPARATION OF MULTI-ELEMENT SALT STANDARDS FOR CALIBRATION OF EDX-SYSTEMS IN STEM USING AEROSOL TECHNIQUES p. C2-389 H.G. Fromme, M. Grote, J. Schaffstein, W. Holländer and B. Bechtloff DOI: https://doi.org/10.1051/jphyscol:1984288 AbstractPDF (1.407 MB)
THEORETICAL STUDY OF THE SPATIAL RESOLUTION OF X-RAY MICROANALYSIS IN ANALYTICAL ELECTRON MICROSCOPY p. C2-393 K. Murata, M. Kawamura and K. Nagami DOI: https://doi.org/10.1051/jphyscol:1984289 AbstractPDF (182.5 KB)
AEM ANALYSIS OF STAINLESS STEEL p. C2-397 R.E. Ogilvie DOI: https://doi.org/10.1051/jphyscol:1984290 AbstractPDF (115.0 KB)
QUANTITATIVE X-RAY ENERGY DISPERSIVE ANALYSIS OF THIN FOILS p. C2-401 W.E. Voice and R.G. Faulkner DOI: https://doi.org/10.1051/jphyscol:1984291 AbstractPDF (362.2 KB)
DETERMINATION OF CLIFF-LORIMER k FACTORS FOR A HITACHI H700H 200 kV SCANNING TRANSMISSION ELECTRON MICROSCOPE p. C2-407 E. Metcalfe and J.P. Broomfield DOI: https://doi.org/10.1051/jphyscol:1984292 AbstractPDF (159.7 KB)
A PARAMETERLESS METHOD TO CORRECT FOR X-RAY ABSORPTION AND FLUORESCENCE I N THIN FILM MICROANALYSIS p. C2-411 E. Van Cappellen, D. Van Dyck, J. Van Landuyt and F. Adams DOI: https://doi.org/10.1051/jphyscol:1984293 AbstractPDF (177.6 KB)
QUANTITATIVE TRANSMISSION ANALYTICAL MICROSCOPY OF SUPERALLOYS p. C2-415 W.E. Voice and R.G. Faulkner DOI: https://doi.org/10.1051/jphyscol:1984294 AbstractPDF (415.6 KB)
ESSAIS DE CARACTÉRISATION DE LA SÉGRÉGATION INTERGRANULAIRE DANS LES JOINTS DE GRAINS D'ALLIAGES Ni - Si EN ANALYSE PAR EMISSION X - STEM p. C2-419 L. Beaunier, H. Dexpert and C. Vignaud DOI: https://doi.org/10.1051/jphyscol:1984295 AbstractPDF (420.5 KB)
TRENDS IN EELS WITHIN THE FIELD OF MICROANALYSIS p. C2-423 R.F. Egerton DOI: https://doi.org/10.1051/jphyscol:1984296 AbstractPDF (785.4 KB)
AN ELECTRON ENERGY LOSS SPECTRAL LIBRARY AND ITS APPLICATION TO MATERIALS SCIENCE p. C2-429 N.J. Zaluzec DOI: https://doi.org/10.1051/jphyscol:1984297 AbstractPDF (480.9 KB)
FINE STRUCTURE IN EELS FROM RARE EARTH SESQUIOXIDE THIN FILMS p. C2-433 L.M. Brown, C. Colliex and M. Gasgnier DOI: https://doi.org/10.1051/jphyscol:1984298 AbstractPDF (482.7 KB)
OBTAINING ELECTRON ENERGY LOSS SPECTRA AND X-RAY EMISSION SPECTRA FREE OF INSTRUMENTAL ARTIFACTS p. C2-437 A.J. Craven, P.F. Adam, W.A.P. Nicholson, J.N. Chapman and R.P. Ferrier DOI: https://doi.org/10.1051/jphyscol:1984299 AbstractPDF (965.1 KB)
MICROANALYSIS TECHNIQUE USING ELECTRON ENERGY LOSS SPECTROSCOPY IN HIGH VOLTAGE ELECTRON MICROSCOPY p. C2-441 J. Sevely, Y. Kihn, G. Zanchi and B. Jouffrey DOI: https://doi.org/10.1051/jphyscol:19842100 AbstractPDF (133.7 KB)
QUANTITATIVE X-RAY MICROANALYSIS OF BIOLOGICAL CRYOSECTIONS DEPENDS ON ICE CRYSTAL DAMAGE p. C2-447 K. Zierold DOI: https://doi.org/10.1051/jphyscol:19842101 AbstractPDF (1.373 MB)
MICROANALYSIS ON BIOLOGICAL MATERIAL - THE ROLE OF PREPARATION METHODS AT LOW TEMPERATURES AND A POSSIBLE LINK WITH (IMMUNO)CYTOCHEMISTRY p. C2-451 P.M. Frederik, P.H.H. Bomans, W.M. Busing and R. Odselius DOI: https://doi.org/10.1051/jphyscol:19842102 AbstractPDF (226.3 KB)
ELECTRON MICROPROBE MEASUREMENTS OF INTRACELLULAR HYDRATION IN FREEZE-DRIED, PLASTIC-EMBEDDED BIOLOGICAL SOFT TISSUE p. C2-457 F.D. Ingram and M.J. Ingram DOI: https://doi.org/10.1051/jphyscol:19842103 AbstractPDF (189.3 KB)
QUANTITATIVE MICROANALYSIS OF CALCIUM SUBCELLULAR COMPARTMENTS IN RESIN-EMBEDDED TISSUE SECTIONS (X-RAY WAVELENGTH DISPERSIVE SPECTROMETRY) p. C2-461 G. Nicaise, J. Amsellem, S. Blaineau and F. Hemming DOI: https://doi.org/10.1051/jphyscol:19842104 AbstractPDF (122.7 KB)
QUANTITATIVE X-RAY MICROANALYSIS OF CALCIUM IN AN OSMIUM-TREATED BIOLOGICAL SPECIMEN p. C2-463 S. Blaineau, J. Amsellem and G. Nicaise DOI: https://doi.org/10.1051/jphyscol:19842105 AbstractPDF (120.1 KB)
QUANTITATIVE ELECTRONPROBE MICROANALYSIS OF THE EPIPHYSEAL GROWTH PLATE p. C2-465 E.-R. Krefting, G. Lissner (Willner) and H.J. Höhling DOI: https://doi.org/10.1051/jphyscol:19842106 AbstractPDF (1.142 MB)
STANDARDS FOR QUANTITATIVE X-RAY MICROANALYSIS OF BIOLOGICAL SPECIMENS p. C2-469 W.C. de Bruijn DOI: https://doi.org/10.1051/jphyscol:19842107 AbstractPDF (1.008 MB)
COMPARISON OF QUANTITATIVE DATA FROM ATOMIC ABSORPTION SPECTROMETRY AND X-RAY MICROANALYSIS FOR INORGANIC AND BIOLOGICAL SAMPLES p. C2-473 P. Mery, D. Chriqui, D.J. Gallant, B. Bouchet and B.K. Tripathi DOI: https://doi.org/10.1051/jphyscol:19842108 AbstractPDF (221.7 KB)
QUANTITATIVE ELECTRON PROBE ANALYSIS OF HAEMOLYMPH AND URINE COMPOSITION FROM INSECT CALLIPHORA ERYTHROCEPHALA DURING METAMORPHOSIS p. C2-481 W. Alkassis, N. Roinel and N. Koechlin DOI: https://doi.org/10.1051/jphyscol:19842109 AbstractPDF (776.3 KB)
ENERGY DISPERSIVE X-RAY MICROANALYSIS OF PLATELETS AND MEGAKARYOCYTES OF SEVERAL MAMMALS USING AIR-DRIED SPREADS AND FRESH FROZEN DRIED SECTIONS p. C2-485 K. Takaya DOI: https://doi.org/10.1051/jphyscol:19842110 AbstractPDF (850.7 KB)
MICROANALYSE X DES ÉLÉMENTS DIFFUSIBLES EN BIOLOGIE VÉGÉTALE p. C2-491 J.-P. Garrec DOI: https://doi.org/10.1051/jphyscol:19842111 AbstractPDF (1.217 MB)
COMPOSITION ÉLÉMENTAIRE DE DIVERS TYPES DE GRANULES DANS LES CELLULES COTYLÉDONAIRES DU RADIS p. C2-495 L. Geneves and S. Halpern DOI: https://doi.org/10.1051/jphyscol:19842112 AbstractPDF (674.4 KB)
ELECTRON MICROPROBE ANALYSIS OF SOUND AND PITTED TISSUES OF APPLE FRUIT AFFECTED WITH BITTER PIT p. C2-499 A. Chamel, P. Bondoux and J.P. Bossy DOI: https://doi.org/10.1051/jphyscol:19842113 AbstractPDF (97.58 KB)
SUR LA LOCALISATION DES ÉLÉMENTS MINÉRAUX DANS LES SUCOIRS D'OSYRIS ALBA L. p. C2-503 S. Renaudin, H. Ben Harrat, D.J. Gallant and B. Bouchet DOI: https://doi.org/10.1051/jphyscol:19842114 AbstractPDF (898.0 KB)
RELATIONS ENTRE LES CONCENTRATIONS EN CALCIUM, MAGNÉSIUM ET PHOSPHORE DANS LES MITOCHONDRIES, LES PROPLASTES ET LES CHLOROPLASTES DU LUPIN JAUNE ET DE LA FÉVEROLE ET LE TAUX DE CALCIUM DU MILIEU DE CULTURE p. C2-507 S. Chevalier and N. Paris-Pireyre DOI: https://doi.org/10.1051/jphyscol:19842115 AbstractPDF (810.8 KB)
LA SILICE CHEZ LE BLÉ (TRITICUM AESTIVUM L.). COMPARAISON ENTRE UNE VARIÉTÉ SENSIBLE ET UNE VARIÉTÉ RÉSISTANTE À LA VERSE p. C2-511 S. Gartner and N. Paris-Pireyre DOI: https://doi.org/10.1051/jphyscol:19842116 AbstractPDF (597.5 KB)
ELECTRON PROBE ANALYSIS OF SAP EXUDATES OF TWO VARIETIES OF WHEAT (TRITICUM AESTIVUM L.) p. C2-515 S. Gartner, N. Roinel and N. Paris-Pireyre DOI: https://doi.org/10.1051/jphyscol:19842117 AbstractPDF (1.356 MB)
MISE EN ÉVIDENCE DE DEUX FONCTIONS LYSOSOMALES THYROIDIENNES EN MICROANALYSE PAR SONDE ÉLECTRONIQUE ET SPECTROMÉTRIE DES RAYONS X p. C2-519 E. Larras-Regard, L. Bessière, S. Halpern and P. Galle DOI: https://doi.org/10.1051/jphyscol:19842118 AbstractPDF (638.1 KB)
DETERMINATION OF FLUORINE IONS PENETRATION DEGREE INTO ENAMEL BY EMPA p. C2-523 D. Beloica, M. Vulovik, I. Gržetik, D. Golijanin and M.K. Pavikevik DOI: https://doi.org/10.1051/jphyscol:19842119 AbstractPDF (177.8 KB)
ASSESSMENT OF INTERSTITIAL LUNG MACROPHAGE PARTICLE BURDEN BY ANALYTICAL TRANSMISSION ELECTRON MICROSCOPE p. C2-529 B. Chamak, P. Sébastien, J.F. Bernaudin, A. Gaudichet and M.C. Pinchon DOI: https://doi.org/10.1051/jphyscol:19842120 AbstractPDF (480.3 KB)
ESSAI D'ANALYSE QUANTITATIVE PAR ÉMISSION IONIQUE SECONDAIRE SUR COUPES HISTOLOGIQUES p. C2-533 M. Truchet DOI: https://doi.org/10.1051/jphyscol:19842121 AbstractPDF (161.5 KB)
DISTRIBUTION DU GALLIUM DANS DIFFÉRENTS TISSUS DE MAMMIFÈRES - ÉTUDE EN MICROANALYSE PAR ÉMISSION IONIQUE SECONDAIRE ET PAR SPECTROMÉTRIE DE RAYONS X p. C2-537 J.P. Berry, S. Galle and F. Escaig DOI: https://doi.org/10.1051/jphyscol:19842122 AbstractPDF (774.1 KB)
THULIUM BIOACCUMULATION BY THE SHORE CRAB CARCINUS MAENAS COLLECTED FROM THE FRENCH COASTS OF THE CHANNEL : A STRUCTURAL, ULTRASTRUCTURAL AND MICROANALYTICAL STUDY BY SECONDARY ION MASS AND X RAY SPECTROMETRY p. C2-541 C. Chassard-Bouchaud, P. Hallegot and M. Meignan DOI: https://doi.org/10.1051/jphyscol:19842123 AbstractPDF (1.008 MB)
UPTAKE, STORAGE AND EXCRETION OF URANIUM BY MYTILUS EDULIS, A STRUCTURAL, ULTRASTRUCTURAL AND MICROANALYTICAL STUDY BY SECONDARY ION EMISSION AND X RAY SPECTROMETRY p. C2-545 C. Chassard-Bouchaud and F. Escaig DOI: https://doi.org/10.1051/jphyscol:19842124 AbstractPDF (1.285 MB)
MÉTHODE POUR L'ÉTUDE EN MICROSCOPIE IONIQUE ANALYTIQUE, PHOTONIQUE ET ÉLECTRONIQUE D'UNE MÊME CELLULE p. C2-549 P. Mandon, F. Escaig and F. Vinzens DOI: https://doi.org/10.1051/jphyscol:19842125 AbstractPDF (1.462 MB)
BIOMEDICAL AND ENVIRONMENTAL APPLICATIONS OF SECONDARY ION EMISSION MICROANALYSIS p. C2-553 R.W. Linton DOI: https://doi.org/10.1051/jphyscol:19842126 AbstractPDF (710.9 KB)
ANALYSE HISTOLOGIQUE PAR MICROSPECTROMÉTRIE RAMAN p. C2-557 M. Truchet DOI: https://doi.org/10.1051/jphyscol:19842127 AbstractPDF (223.1 KB)
DOPED ALBUMIN : STANDARDIZATION POSSIBILITIES FOR LAMMA-ANALYSIS OF THIN FREEZE-DRIED CRYOSECTIONS OF BIOLOGICAL TISSUE p. C2-561 A.H. Verbueken, W.A. Jacob, P .M. Frederik, W.M. Busing, R.C. Hertsens and R.E. Van Grieken DOI: https://doi.org/10.1051/jphyscol:19842128 AbstractPDF (180.9 KB)
RESULTS ON TAXONOMY AND PHYSIOLOGICAL STATE OF BACTERIA DERIVED FROM LASER-INDUCED SINGLE CELL ANALYSIS p. C2-565 B. Lindner and U. Seydel DOI: https://doi.org/10.1051/jphyscol:19842129 AbstractPDF (130.7 KB)
THE USE OF LASER MICROPROBE MASS ANALYSIS IN BIOMEDICAL RESEARCH p. C2-569 P.F. Schmidt and H. Zumkley DOI: https://doi.org/10.1051/jphyscol:19842130 AbstractPDF (917.1 KB)
MICROANALYSIS WITH THE LASER PROBE MASS SPECTROGRAPH (LPMS) IN PLANT BIOLOGY p. C2-573 A. Chamel and J.-F. Eloy DOI: https://doi.org/10.1051/jphyscol:19842131 AbstractPDF (159.1 KB)
RECENT RESULTS IN EELS ELEMENTAL MAPPING OF THIN BIOLOGICAL SECTIONS p. C2-577 C. Jeanguillaume, J.P. Berry, C. Colliex, P. Galle, M. Tence and P . Trebbia DOI: https://doi.org/10.1051/jphyscol:19842132 AbstractPDF (1.224 MB)
APPLICATION DE LA SPECTROSCOPIE DE PERTES D'ÉNERGIE D'ÉLECTRONS À HAUTE TENSION À L'ANALYSE DE MICROPARTICULES DANS DES COUPES DE TISSUS BIOLOGIQUES p. C2-581 J.P. Berry, P. Galle, Y. Kihn, G. Zanchi, J. Sevely and B. Jouffrey DOI: https://doi.org/10.1051/jphyscol:19842133 AbstractPDF (1.190 MB)
AN EELS STUDY OF THE INTRANUCLEAR INCLUSIONS OF THE EPIDIDYMIS PRINCIPAL CELLS IN THE GARDEN DORMOUSE, ELIOMYS QUERCINUS L. p. C2-585 F. Hawkes, Y. Kihn and J. Sevely DOI: https://doi.org/10.1051/jphyscol:19842134 AbstractPDF (786.6 KB)
CADMIUM DISTRIBUTION IN INSECT TESTIS AFTER A SINGLE INJECTION, AN EELS STUDY p. C2-587 F. Hawkes and Wu Ming-jun DOI: https://doi.org/10.1051/jphyscol:19842135 AbstractPDF (63.03 KB)
PLATINUM DISTRIBUTION IN INSECT TESTIS AFTER CIS-DIAMMINEDICHLOROPLATINUM TREATMENT, AN EELS STUDY IN THE HOUSE CRICKET, ACHETA DOMESTICUS p. C2-589 F. Hawkes DOI: https://doi.org/10.1051/jphyscol:19842136 AbstractPDF (51.09 KB)
GALLIUM DISTRIBUTION IN INSECT TESTIS AFTER AN INJECTION OF GaCl3, AN EELS STUDY IN THE HOUSE CRICKET, ACHETA DOMESTICUS p. C2-591 F. Hawkes DOI: https://doi.org/10.1051/jphyscol:19842137 AbstractPDF (329.2 KB)
INDIUM DISTRIBUTION IN INSECT TESTIS AFTER AN INJECTION OF InCl3, AN EELS STUDY IN THE HOUSE CRICKET, ACHETA DOMESTICUS p. C2-593 F. Hawkes DOI: https://doi.org/10.1051/jphyscol:19842138 AbstractPDF (310.8 KB)
CATION BINDING TO ANIONIC BIOPOLYMERS OF VASCULAR CONNECTIVE TISSUE p. C2-595 G. Siegel, A. Walter and B. Lindman DOI: https://doi.org/10.1051/jphyscol:19842139 AbstractPDF (812.6 KB)
ASPECTS MORPHOLOGIQUES DE LA CROISSANCE CRISTALLINE D'UN CALCUL RÉNAL p. C2-599 Z. Fakhfakh and A. El Hili DOI: https://doi.org/10.1051/jphyscol:19842140 AbstractPDF (514.5 KB)
UTILISATION DE LA SPECTROSCOPIE DE PERTES D'ÉNERGIE D'ÉLECTRONS À L'IDENTIFICATION DE DÉPÔTS INTRA-RÉNAUX p. C2-603 M. Mignon-Conte, F. Carentz, J. Pourrat, J.J. Conte, Y. Kihn and J. Sevely DOI: https://doi.org/10.1051/jphyscol:19842141 AbstractPDF (1.543 MB)
QUANTITATIVE ELECTRON PROBE MICROANALYSIS OF CARBON IN CARBIDES USING A GAUSSIAN ϕ( ρz) EQUATION p. C2-609 J.D. Brown, P. Schwaab and A.P. von Rosenstiel DOI: https://doi.org/10.1051/jphyscol:19842142 AbstractPDF (156.4 KB)
X-RAY ANALYSIS OF CARBON IN 316 AUSTENITIC STAINLESS STEEL : RESULTS OF A GERMAN-FRENCH ROUND ROBIN TEST p. C2-613 L. Meny, C.T. Walker and M. Champigny DOI: https://doi.org/10.1051/jphyscol:19842143 AbstractPDF (179.2 KB)
APPLICATION DES MESURES DE DÉPLACEMENTS ÉNERGÉTIQUES DE LIGNES D'ÉMISSION X Mn Lα1,2 À L'IDENTIFICATION DES OXYDES DE MANGANÈSE p. C2-617 St. Jasieska and D. Tomkowicz DOI: https://doi.org/10.1051/jphyscol:19842144 AbstractPDF (177.9 KB)
ELECTRON PROBE MICROANALYSIS OF SUBMICRON ALLOY FILMS p. C2-621 P. Willich DOI: https://doi.org/10.1051/jphyscol:19842145 AbstractPDF (200.8 KB)
STUDY ON RELATIONSHIP OF PHASES IN ALLOYS BY MEANS OF EPMA p. C2-625 Xu Leying, Zhu Yaoxiao, Li Yiyi and Shi Changhsu DOI: https://doi.org/10.1051/jphyscol:19842146 AbstractPDF (966.0 KB)
A STUDY OF Au-Cu MINERALS USING THE ELECTRON PROBE p. C2-631 S.H. Mao and Y.X. Liu DOI: https://doi.org/10.1051/jphyscol:19842147 AbstractPDF (1.038 MB)
ANALYSE D' INCLUSIONS D'OXYDES RESPONSABLES DE DÉFAUTS DE SURFACE INTERNE APPARAISSANT AU COURS DE LA FABRICATION DE TUBES SANS SOUDURE p. C2-635 A. Harabi and R. Mevrel DOI: https://doi.org/10.1051/jphyscol:19842148 AbstractPDF (413.3 KB)
AN ELECTRON MICROSCOPE STUDY OF INCLUSIONS IN SUBMERGED-ARC STEEL WELDS p. C2-639 A.R. Bhatti DOI: https://doi.org/10.1051/jphyscol:19842149 AbstractPDF (430.3 KB)
X-RAY AND AUGER ELECTRON MICROANALYSIS IN STUDY OF THE CONTACT ZONE OF STEELS UNDER FRICTION p. C2-643 V.V. Nemoshkalenko, V.V. Gorsky, E.K. Ivanova and A.B. Goncharenko DOI: https://doi.org/10.1051/jphyscol:19842150 AbstractPDF (259.6 KB)
SPECIFIC CONTRIBUTIONS OF SIMS AND XPS TO STUDIES OF THERMAL OXIDE FILM p. C2-647 J.C. Pivin and D. Loison DOI: https://doi.org/10.1051/jphyscol:19842151 AbstractPDF (622.2 KB)
CHARACTERIZATION OF OXIDE FILMS ON Fe-Cr-Al ALLOYS AND RF-SPUTTERED FILMS BY SOFT X-RAY SPECTROSCOPY AND MICROANALYSIS p. C2-653 S. Maruno DOI: https://doi.org/10.1051/jphyscol:19842152 AbstractPDF (2.184 MB)
MICRO-ANALYSE DE CRISTAUX EN CROISSANCE SUR UNE SURFACE DE SILICIUM p. C2-657 J. Beauvillain, A. Claverie, Y. Kihn, J. Sevely and B. Jouffrey DOI: https://doi.org/10.1051/jphyscol:19842153 AbstractPDF (864.6 KB)
RAMAN MICROPROBE SPECTROSCOPY OF CORROSION PRODUCTS FORMED ON ELECTRODES SUBJECTED TO CORONA DISCHARGES p. C2-661 R. Le Ny, C. Fiaud and A.T. Nguyen DOI: https://doi.org/10.1051/jphyscol:19842154 AbstractPDF (921.2 KB)
THE CHARACTERISATION OF "ALUMINISED" INCONEL p. C2-665 I.F. Ferguson, T.E. Hughes, A. Huyton and B.F.Riley DOI: https://doi.org/10.1051/jphyscol:19842155 AbstractPDF (1.155 MB)
IDENTIFICATION ET ANALYSE DES PHASES DANS LES ACIERS AU MOYEN DE L'ÉMISSION IONIQUE SECONDAIRE p. C2-673 R. Namdar, D. Loison and R. Tixier DOI: https://doi.org/10.1051/jphyscol:19842156 AbstractPDF (227.4 KB)
OBSERVATIONS OF AMORPHOUS ALLOY CHARACTERISTICS USING THE SCANNING MICROSCOPE p. C2-679 J. Fléchon, F. Machizaud, F.A. Kuhnast, G. Mbemba, A. Obaida and A. Kohler DOI: https://doi.org/10.1051/jphyscol:19842157 AbstractPDF (899.2 KB)
MÉCANIQUE DES SOLIDES MICROHÉTÉROGÈNES ET EXTENSOMÉTRIE LOCALE p. C2-683 T. Bretheau and P. Viaris de Lesegno DOI: https://doi.org/10.1051/jphyscol:19842158 AbstractPDF (854.5 KB)
PROTOCOLE POUR UNE ANALYSE QUANTITATIVE DES PRODUITS DE COMBUSTION D'UN FUEL LOURD PAR MICROSCOPIE ÉLECTRONIQUE p. C2-687 R. Capron and P. Haymann DOI: https://doi.org/10.1051/jphyscol:19842159 AbstractPDF (88.25 KB)
IDENTIFICATION DE PRÉCIPITÉS DE NITRURE D'ALUMINIUM DANS DES ÉCHANTILLONS DE FER p. C2-691 A. Fourdeux, J. Sevely, G. Zanchi and Y. Kihn DOI: https://doi.org/10.1051/jphyscol:19842160 AbstractPDF (968.8 KB)
MICROANALYSE DES JOINTS CARBURE-CARBURE DANS LES COMPOSITES CARBURE DE TUNGSTÈNE-COBALT p. C2-695 J.Y. Laval, J. Vicens and G. Nouet DOI: https://doi.org/10.1051/jphyscol:19842161 AbstractPDF (1.841 MB)
X-RAY EMISSION SPECTROSCOPY OF INDUSTRIAL CATALYSTS IN THE STEM p. C2-701 J. Lynch DOI: https://doi.org/10.1051/jphyscol:19842162 AbstractPDF (1.075 MB)
APPLICATIONS OF A.E.M. TO RAPIDLY SOLIDIFIED MATERIALS p. C2-705 J.B. Vander Sande and A.J. Garratt-Reed DOI: https://doi.org/10.1051/jphyscol:19842163 AbstractPDF (1.278 MB)
EELS ANALYSIS OF A PRECIPITATE IN V3Si BY STEM AND HVEM p. C2-709 A. Ben Lamine, F. Reynaud, C. Colliex, M. Acheche, J. Sevely and Y. Kihn DOI: https://doi.org/10.1051/jphyscol:19842164 AbstractPDF (966.8 KB)
ÉTUDE À L'ÉCHELLE MOLÉCULAIRE, DE LA COMPOSITION, DE LA STRUCTURE ET DES PROPRIÉTÉS ÉLECTRONIQUES D'UN FILM DE POLYMÈRE ÉLECTROPOLYMÉRISÉ p. C2-713 G. Lecayon DOI: https://doi.org/10.1051/jphyscol:19842165 AbstractPDF (189.4 KB)
MICROANALYSE SUR LAMES MINCES, APPLICATION AUX SUPERALLIAGES MONOCRISTALLINS p. C2-717 C. Le Pipec DOI: https://doi.org/10.1051/jphyscol:19842166 AbstractPDF (124.8 KB)
DEPTH PROFILING AND MICROANALYSIS OF HYDROGEN IN TITANIUM p. C2-721 D.R. Beaman, H.E. Klassen, L.F. Solosky and D.M. File DOI: https://doi.org/10.1051/jphyscol:19842167 AbstractPDF (972.5 KB)
APPORTS DE LA MICROSONDE ÉLECTRONIQUE À L'ÉTUDE CRISTALLOCHIMIQUE DES SULFURES COMPLEXES NATURELS D'ANTIMOINE ET PLOMB p. C2-731 Y. Moëlo, R. Giraud and G. Remond DOI: https://doi.org/10.1051/jphyscol:19842168 AbstractPDF (199.3 KB)
APPLICATION DE LA MICROSONDE ÉLECTRONIQUE À L'ANALYSE QUANTITATIVE DES PHASES MINÉRALOGIQUES DES AGGLOMÉRÉS DE MINERAIS DE FER p. C2-735 S. Alfonsi, P. Barnaba, S. Fioravanti, J. Gelli, C. Modena and G. Pareto DOI: https://doi.org/10.1051/jphyscol:19842169 AbstractPDF (735.0 KB)
EVALUATION DES SUBSTITUTIONS IONIQUES DES COMPOSANTS À L'ÉTAT SOLIDE AU MOYEN DU MEB ET DU MICROANALYSEUR À RAYONS X p. C2-741 M. Grazzini, R. Cencioni and G. Formiconi DOI: https://doi.org/10.1051/jphyscol:19842170 AbstractPDF (132.3 KB)
APPLICATION OF EPMA OF ALMANDINE GARNETS TO REGIONAL GEOLOGICAL PROBLEMS IN THE LOWER PALEOZOIC BASEMENT OF THE NW-ARGENTINE ANDES p. C2-745 G. Lissner and A.P. Willner DOI: https://doi.org/10.1051/jphyscol:19842171 AbstractPDF (83.53 KB)
USE OF EPMA AND SEM IN THE STUDY OF HIGH TEMPERATURE REACTIONS IN OXIDE SYSTEMS p. C2-747 M. Trontelj, D. Kolar and M. Kosec DOI: https://doi.org/10.1051/jphyscol:19842172 AbstractPDF (976.9 KB)
LES COMPLEXES ORGANO-MINÉRAUX DANS LES SOLS. CARACTÉRISATION MORPHOLOGIQUE ET MICROSTRUCTURALE PAR MICROSCOPIE ÉLECTRONIQUE ET SPECTROMÉTRIE X p. C2-751 Nguyen Kha DOI: https://doi.org/10.1051/jphyscol:19842173 AbstractPDF (1.308 MB)
ELECTRON MICROPROBE STUDIES ON MONOMODE OPTICAL FIBRES AND PREFORMS PREPARED BY THE MCVD TECHNIQUE p. C2-757 A.P. Skeats and B.J. Ainslie DOI: https://doi.org/10.1051/jphyscol:19842174 AbstractPDF (1.050 MB)
SEMIQUANTITATIVE X-RAY MICROANALYSIS ON PREFORMS FOR OPTICAL WAVEGUIDE FIBRES p. C2-761 J. Hersener, H.-P. Huber and J. Von Wienskowski DOI: https://doi.org/10.1051/jphyscol:19842175 AbstractPDF (1.324 MB)
MICROANALYSE RAMAN DE PRÉFORMES ET FIBRES OPTIQUES p. C2-765 W. Carvalho and P. Dumas DOI: https://doi.org/10.1051/jphyscol:19842176 AbstractPDF (145.6 KB)
GLASSES FOR MICROANALYSIS : NEW NBS (U.S.A.) STANDARD REFERENCE MATERIALS p. C2-769 R.B. Marinenko and D.H. Blackburn DOI: https://doi.org/10.1051/jphyscol:19842177 AbstractPDF (173.8 KB)
MICROBEAM ANALYSIS OF SAMPLES OF UNUSUAL SHAPE p. C2-775 D.E. Newbury DOI: https://doi.org/10.1051/jphyscol:19842178 AbstractPDF (416.5 KB)
AUTOMATED QUANTITATIVE ELECTRON MICROPROBE ANALYSIS OF PARTICULATE MATERIAL p. C2-781 P. Van Dyck, H. Storms and R. Van Grieken DOI: https://doi.org/10.1051/jphyscol:19842179 AbstractPDF (171.1 KB)
LAMMA AND ELECTRON MICROPROBE ANALYSIS OF ATMOSPHERIC AEROSOLS p. C2-785 F. Bruynseels, H. Storms and R. Van Grieken DOI: https://doi.org/10.1051/jphyscol:19842180 AbstractPDF (163.9 KB)
CARACTÉRISATION DE FINES PARTICULES DANS DIVERS PRÉLÈVEMENTS ATMOSPHÉRIQUES EN MICROSCOPIE ANALYTIQUE EN TRANSMISSION p. C2-789 A. Gaudichet DOI: https://doi.org/10.1051/jphyscol:19842181 AbstractPDF (468.6 KB)
UTILISATION D'UN MICROSCOPE STEM POUR L'ANALYSE DE MINÉRAUX MICROCRISTALLISÉS, PAR SPECTROSCOPIE X ET PAR SPECTROSCOPIE DES PERTES D'ÉNERGIE p. C2-793 M. Rautureau, M. Steinberg, C. Colliex, C. Morry and P. Trebbia DOI: https://doi.org/10.1051/jphyscol:19842182 AbstractPDF (377.8 KB)
TECHNIQUES D'ANALYSE QUANTITATIVE PAR ÉMISSION IONIQUE SECONDAIRE : APPLICATION AUX MESURES ET AUX MICROGRAPHIES IONIQUES EN PÉTROLOGIE p. C2-797 A. Havette DOI: https://doi.org/10.1051/jphyscol:19842183 AbstractPDF (136.7 KB)
ANALYSE DES SURFACES SOLIDES PAR S.I.M.S. UTILISANT UN FAISCEAU PRIMAIRE DE PARTICULES NEUTRALISÉES p. C2-801 G. Borchardt, S. Weber, H. Scherrer and S. Scherrer DOI: https://doi.org/10.1051/jphyscol:19842184 AbstractPDF (157.6 KB)
LA MICROANALYSE PAR EFFET RAMAN DES SÉDIMENTS CARBONATÉS : PROBLÈMES D'INTERPRÉTATION DES SPECTRES p. C2-805 J. Archambault, A. Lautie and R. Lefevre DOI: https://doi.org/10.1051/jphyscol:19842185 AbstractPDF (185.0 KB)
APPLICATIONS OF THE MOLE RAMAN MICROPROBE TO THE STUDY OF FLUID INCLUSIONS IN MINERALS p. C2-811 J. Dubessy, C. Beny, N. Guilhaumou, P. Dhamelincourt and B. Poty DOI: https://doi.org/10.1051/jphyscol:19842186 AbstractPDF (650.4 KB)
MICROANALYSE DE VERRES POUR LE STOCKAGE DES DÉCHETS DE HAUTE ACTIVITÉ p. C2-815 J.P. Morlevat DOI: https://doi.org/10.1051/jphyscol:19842187 AbstractPDF (827.0 KB)
ÉTUDE DE LA DÉTECTION DES HYDROCARBURES AROMATIQUES POLYCYCLIQUES AU NIVEAU DE MICROPARTICULES DE NATURE DIFFÉRENTE PAR MICROSONDE À IMPACT LASER LAMMA p. C2-819 F. Verdun and J.F. Muller DOI: https://doi.org/10.1051/jphyscol:19842188 AbstractPDF (412.5 KB)
APPLICATION DE LA MICROSONDE BLINDÉE À L'ANALYSE DE RÉSIDUS DE DISSOLUTION DES COMBUSTIBLES NUCLÉAIRES p. C2-825 M. Perrot and M. Trotabas DOI: https://doi.org/10.1051/jphyscol:19842189 AbstractPDF (133.9 KB)
THE USE OF THE ELECTRON-PROBE MICROANALYSER TO DETERMINE THE RADIAL DISTRIBUTION OF FISSION PRODUCTS IN IRRADIATED THERMAL REACTOR FUEL p. C2-829 J.H. Pearce DOI: https://doi.org/10.1051/jphyscol:19842190 AbstractPDF (604.4 KB)
LOCALIZING FISSION PRODUCTS IN IRRADIATED NUCLEAR FUEL PARTICLES WITH THE UNSHIELDED ELECTRON MICROPROBE p. C2-833 H.B. Grübmeier DOI: https://doi.org/10.1051/jphyscol:19842191 AbstractPDF (1.212 MB)
ÉVOLUTION DE LA COMPOSITION CHIMIQUE D'ACIERS INOXYDABLES SOUS IRRADIATION PAR LES NEUTRONS RAPIDES p. C2-837 L. Boulanger, H. Lorant and M.P. Hugon DOI: https://doi.org/10.1051/jphyscol:19842192 AbstractPDF (1.146 MB)
APPLICATION OF ESCA AND AES TO HIGHLY RADIOACTIVE MATERIALS p. C2-841 J.R. Naegele DOI: https://doi.org/10.1051/jphyscol:19842193 AbstractPDF (661.8 KB)
INSTALLATION D'UN MICROSCOPE ÉLECTRONIQUE À BALAYAGE POUR EXAMEN DE MATÉRIAUX IRRADIÉS p. C2-845 M. Coquerelle, P. Knappik and Cl. Perrier DOI: https://doi.org/10.1051/jphyscol:19842194 AbstractPDF (875.8 KB)
THE EXAMINATION OF NUCLEAR FUEL SAMPLES BY SCANNING TRANSMISSION ELECTRON MICROSCOPY p. C2-849 I.L.F. Ray, H. Thiele and H. Blank DOI: https://doi.org/10.1051/jphyscol:19842195 AbstractPDF (1.000 MB)
STUDIES OF SEMICONDUCTORS WITH ELECTRON AND ION BEAMS p. C2-855 D.B. Wittry DOI: https://doi.org/10.1051/jphyscol:19842196 AbstractPDF (441.2 KB)
SEM EBIC INVESTIGATIONS OF ZnO VARISTOR CERAMICS p. C2-861 A. Bernds, K. Löhnert and E. Kubalek DOI: https://doi.org/10.1051/jphyscol:19842197 AbstractPDF (749.9 KB)
MINORITY CARRIER LIFETIME MEASUREMENTS IN SEMICONDUCTOR DEVICES MONITORED BY A MICROPROCESSOR IN E.B.I.C, MODE p. C2-865 J.F. Bresse and D. Rivière DOI: https://doi.org/10.1051/jphyscol:19842198 AbstractPDF (972.5 KB)
NONLINEAR SCANNING ELECTRON ACOUSTIC MICROSCOPY p. C2-869 L.J. Balk and N. Kultscher DOI: https://doi.org/10.1051/jphyscol:19842199 AbstractPDF (1.216 MB)
SCANNING ELECTRON ACOUSTIC MICROSCOPY WITH SUBNANOSECOND TIME RESOLUTION p. C2-873 L.J. Balk and N. Kultscher DOI: https://doi.org/10.1051/jphyscol:19842200 AbstractPDF (2.165 MB)
THERMAL WAVE IMAGING OF GaAs MATERIAL AND DEVICES p. C2-877 T.D. Kirkendall and T.P. Remmel DOI: https://doi.org/10.1051/jphyscol:19842201 AbstractPDF (1.738 MB)
SMALL AREA MOLECULAR ANALYSIS AS APPLIED IN THE MICROELECTRONICS INDUSTRY p. C2-881 J.N. Ramsey DOI: https://doi.org/10.1051/jphyscol:19842202 AbstractPDF (1.161 MB)
ELECTRONIC STRUCTURE OF AMORPHOUS Si3N4 p. C2-887 I.A. Brytov, E.A. Obolenskii, Yu.N. Romashchenko and V.A. Gritsenko DOI: https://doi.org/10.1051/jphyscol:19842203 AbstractPDF (715.8 KB)
X RAYS AND ELECTRON MICROPROBE ANALYSIS OF III-V SEMICONDUCTORS p. C2-891 C. Schiller and M. Duseaux DOI: https://doi.org/10.1051/jphyscol:19842204 AbstractPDF (505.3 KB)
AUTOMATED MEASUREMENTS OF INTEGRATED CIRCUIT LINEWIDTHS BY ELECTRON MICROSCOPY p. C2-895 G.S. Fritz, J.J. McCarthy and J. Benson DOI: https://doi.org/10.1051/jphyscol:19842205 AbstractPDF (1.521 MB)
X-RAY SPECTROSCOPY OF HUMAN SKIN AS A CONTAMINANT ON SEMICONDUCTORS p. C2-899 J.A. Lange DOI: https://doi.org/10.1051/jphyscol:19842206 AbstractPDF (469.1 KB)
CRYSTALLINE STRUCTURE AND DOPING LEVEL OF THIN ELECTROLUMINESCENT ZnS:Mn LAYERS p. C2-903 A. Izrael, P. Thioulouse and R. Tueta DOI: https://doi.org/10.1051/jphyscol:19842207 AbstractPDF (789.1 KB)
