| Numéro |
J. Phys. Colloques
Volume 45, Numéro C2, Février 1984
10ème Congrès International d'Optique des Rayons X et de Microanalyse 10th International Congress on X-Ray Optics and Microanalysis |
|
|---|---|---|
| Page(s) | C2-855 - C2-860 | |
| DOI | https://doi.org/10.1051/jphyscol:19842196 | |
10ème Congrès International d'Optique des Rayons X et de Microanalyse
10th International Congress on X-Ray Optics and Microanalysis
J. Phys. Colloques 45 (1984) C2-855-C2-860
DOI: 10.1051/jphyscol:19842196
Departments of Materials Science and Electrical Engineering, University of Southern California, University Park MC 0241, Los Angeles, CA 90089-0241, U.S.A.
10th International Congress on X-Ray Optics and Microanalysis
J. Phys. Colloques 45 (1984) C2-855-C2-860
DOI: 10.1051/jphyscol:19842196
STUDIES OF SEMICONDUCTORS WITH ELECTRON AND ION BEAMS
D.B. WittryDepartments of Materials Science and Electrical Engineering, University of Southern California, University Park MC 0241, Los Angeles, CA 90089-0241, U.S.A.
Résumé
On passe en revue les expériences menées à l'aide des électrons et des faisceaux de particules pour l'étude des semiconducteurs menée à "The University of Southern California".
Abstract
Experiments involving the use of electron and beams for the study of semiconductors that have been carried out at the University of Southern California are reviewed.