| Issue |
J. Phys. Colloques
Volume 45, Number C2, Février 1984
10ème Congrès International d'Optique des Rayons X et de Microanalyse 10th International Congress on X-Ray Optics and Microanalysis |
|
|---|---|---|
| Page(s) | C2-211 - C2-214 | |
| DOI | https://doi.org/10.1051/jphyscol:1984246 | |
10ème Congrès International d'Optique des Rayons X et de Microanalyse
10th International Congress on X-Ray Optics and Microanalysis
J. Phys. Colloques 45 (1984) C2-211-C2-214
DOI: 10.1051/jphyscol:1984246
Mineral Technology Department, Imperial College, London, U.K.
10th International Congress on X-Ray Optics and Microanalysis
J. Phys. Colloques 45 (1984) C2-211-C2-214
DOI: 10.1051/jphyscol:1984246
USE OF THE X-RAY MICROANALYSER AS AN IMAGE ANALYSER
M.P. JonesMineral Technology Department, Imperial College, London, U.K.
Résumé
Cette contribution décrit l'utilisation en analyseur d'images d'un appareil Camebax-Micro. La configuration initiale utilisait quatre spectromètres à cristaux. On y a inclu le signal dû aux électrons rétrodiffusés. On décrit la technique d'adaptation et on présente quelques exemples d'applications.
Abstract
This paper describes how the Camebax-Micro has been adapted for use as an automatic image analyser. Initially, the system was based on the simultaneous use of four wavelength-dispersive spectrometers but the system has been developed to incorporate the back-scattered electron signal. Details are provided of the way the microanalyser was converted and examples are given of the results that are being produced.