Supplément au Journal de Physique Colloques

OPTICAL CHARACTERIZATION BY ELLIPSOMETRY – A PROSPECTIVE p. C10-3

D.E. Aspnes

DOI: https://doi.org/10.1051/jphyscol:19831001

IR SURFACE PLASMON SPECTROSCOPY p. C10-13

A.J. Sievers and Z. Schlesinger

DOI: https://doi.org/10.1051/jphyscol:19831002

ON THE ACCURACY OF ELLIPSOMETRIC THICKNESS DETERMINATIONS FOR VERY THIN FILMS p. C10-23

D. Chandler-Horowitz and G.A. Candela

DOI: https://doi.org/10.1051/jphyscol:19831003

ELLIPSOMETRIC FORMULAS FOR AN INDEX PROFILE OF SMALL AMPLITUDE BUT ARBITRARY SHAPE p. C10-27

J.C. Charmet and P.G. de Gennes

DOI: https://doi.org/10.1051/jphyscol:19831004

OPTICAL CONSTANTS OF LAYER STRUCTURES FROM ELLIPSOMETRIC DATA p. C10-31

S. Logothetidis and J. Spyridelis

DOI: https://doi.org/10.1051/jphyscol:19831005

ELLIPSOMETRY OF THICK (d>λ) TRANSPARENT FILMS USING CHANNELLED SPECTRUM p. C10-35

M. Yamamoto

DOI: https://doi.org/10.1051/jphyscol:19831006

DETERMINATION OF THE OPTICAL PROPERTIES OF GaAs AND InP BY MULTIPLE ANGLE OF INCIDENCE ELLIPSOMETRY p. C10-39

H.W. Dinges

DOI: https://doi.org/10.1051/jphyscol:19831007

ELLIPSOMETRIC STUDIES OF GaAs_1-xP_x : FOURIER ANALYSIS OF CRITICAL POINT COMPLEXES p. C10-45

S.M. Kelso and D.E. Aspnes

DOI: https://doi.org/10.1051/jphyscol:19831008

THE ANISOTROPY OF THE PbTe FILMS OBLIQUELY DEPOSITED IN VACUUM STUDIED BY ELLIPSOMETRY AND PHOTOVOLTAIC EFFECT p. C10-49

E. Zamfir and C. Oancea

DOI: https://doi.org/10.1051/jphyscol:19831009

A MICROPROCESSOR CONTROLLED SPECTROELLIPSOMETER FOR STUDY OF ELECTROCHEMICAL SYSTEMS p. C10-53

S.V. Pihlajamäki and J.J. Kankare

DOI: https://doi.org/10.1051/jphyscol:19831010

FAST, SELF-NULLING SPECTROSCOPIC ELLIPSOMETER : INSTRUMENTATION AND APPLICATION p. C10-57

R.H. Muller and J.C. Farmer

DOI: https://doi.org/10.1051/jphyscol:19831011

A RETARDATION MODULATION ELLIPSOMETER FOR STUDYING FAST SURFACE TRANSIENTS p. C10-63

A. Moritani, Y. Okuda and S. Nakai

DOI: https://doi.org/10.1051/jphyscol:19831012

ELLIPSOMETRY OF UNSUPPORTED AND EMBEDDED THIN FILMS p. C10-67

R.M.A. Azzam

DOI: https://doi.org/10.1051/jphyscol:19831013

THEORY, IMPLEMENTATION AND APPLICATIONS OF AIDER p. C10-71

R.M.A. Azzam

DOI: https://doi.org/10.1051/jphyscol:19831014

DIFFERENTIAL ELLIPSOMETRY p. C10-75

T. Sandström

DOI: https://doi.org/10.1051/jphyscol:19831015

GEOMETRICAL RESOLUTION IN THE COMPARISON ELLIPSOMETER p. C10-79

L. Stiblert and T. Sandström

DOI: https://doi.org/10.1051/jphyscol:19831016

THE USE OF THE ISOSCOPE ELLIPSOMETER IN THE STUDY OF ADSORBED PROTEINS AND BIOSPECIFIC BINDING REACTIONS p. C10-83

M. Stenberg and H. Nygren

DOI: https://doi.org/10.1051/jphyscol:19831017

INFRARED ELLIPSOMETRY – A NEW TECHNIQUE FOR CHARACTERIZATION OF DOPANT PARAMETERS IN SILICON p. C10-87

R.R. Schaefer

DOI: https://doi.org/10.1051/jphyscol:19831018

REFLECTIVITE HEMISPHERIQUE ET DIFFUSE DE COUCHES MINCES DE TUNGSTENE PREPAREES PAR DECOMPOSITION EN PHASE VAPEUR p. C10-91

B. Yous, A. Donnadieu and S. Robin

DOI: https://doi.org/10.1051/jphyscol:19831019

DETERMINATION OF THE GROWTH RATES OF Au₂Al DIFFUSIONALLY FORMED IN THIN STEP-SHAPED Au-Al COUPLES p. C10-95

I.M. Reda, A. Wagendristel, H. Bangert and P. Schattschneider

DOI: https://doi.org/10.1051/jphyscol:19831020

A COMPUTER INTEGRATED SPECTROPHOTOMETER FOR FILM THICKNESS MONITORING p. C10-101

H.-E. Korth

DOI: https://doi.org/10.1051/jphyscol:19831021

DIFFERENTIAL REFLECTOMETRY p. C10-105

R.E. Hummel

DOI: https://doi.org/10.1051/jphyscol:19831022

ACCURACY IN THE DETERMINATION OF THIN FILMS OPTICAL CONSTANTS BY THE ATR METHOD p. C10-109

G. Hincelin

DOI: https://doi.org/10.1051/jphyscol:19831023

INVESTIGATION OF A VERY THIN AND INHOMOGENEOUS FILM OF SiO FROM SURFACE PLASMON OPTICAL EXCITATION p. C10-113

D. Rivière and G.R. Roger

DOI: https://doi.org/10.1051/jphyscol:19831024

DETERMINATION OF THE DIELECTRIC CONSTANT OF CdS BY ELLIPSOMETRY, INTERFEROMETRY AND BY OPTICAL EXCITATION OF SURFACE PLASMONS p. C10-119

M. Abraham, A. Mahmoudi, A. Tadjeddine and J.P. Rolland

DOI: https://doi.org/10.1051/jphyscol:19831025

BROADBAND SPECTROSCOPY OF ULTRATHIN LAYERS BY OPTICAL GUIDED WAVES TECHNIQUES, APPLICATION TO A 80 Å THICK a - Si : H LAYER p. C10-123

M. Olivier, J.C. Peuzin and A. Chenevas-Paule

DOI: https://doi.org/10.1051/jphyscol:19831026

ANISOTROPIC REFRACTIVE INDICES OF CADMIUM SULFIDE THIN FILM ON A SLAB-TYPE OPTICAL WAVEGUIDE p. C10-127

K. Sasaki, T. Shimizu, O. Nonaka, O. Hamano and M. Serizawa

DOI: https://doi.org/10.1051/jphyscol:19831027

CHARACTERIZATION OF DIELECTRIC FILMS ON SEMICONDUCTOR SUBSTRATES BY LEAKY-MODES MEASUREMENT p. C10-131

J.-P. Gruson, P.-J. Goirand, F. Cochet and O. Parriaux

DOI: https://doi.org/10.1051/jphyscol:19831028

ELECTROREFLECTANCE SPECTROSCOPY IN THE STUDY OF METAL-ELECTROLYTE INTERFACES p. C10-137

D.M. Kolb

DOI: https://doi.org/10.1051/jphyscol:19831029

ELLIPSOMETRY OF LIQUID SURFACES p. C10-147

D. Beaglehole

DOI: https://doi.org/10.1051/jphyscol:19831030

LIGHT SCATTERING AND REFLECTIVITY OF LIQUID INTERFACES p. C10-155

D. Langevin and J. Meunier

DOI: https://doi.org/10.1051/jphyscol:19831031

CHARACTERIZATION OF SURFACE STATES AT A SEMICONDUCTOR ELECTROLYTE INTERFACE BY ELECTROLYTE ELECTROREFLECTANCE SPECTROSCOPY p. C10-163

M. Tomkiewicz and W. Siripala

DOI: https://doi.org/10.1051/jphyscol:19831032

CHARACTERIZATION OF SEMICONDUCTOR ELECTROLYTE INTERFACE BY MODULATED PHOTOLUMINESCENCE p. C10-167

M. Tomkiewicz and R. Garuthara

DOI: https://doi.org/10.1051/jphyscol:19831033

ATR STUDIES OF WATER ON EMERSED ELECTRODES p. C10-171

J.G. Gordon II

DOI: https://doi.org/10.1051/jphyscol:19831034

OPTICAL ABSORPTION OF MOLECULES IN THE ELECTRIC FIELD OF THE DOUBLE LAYER p. C10-175

P. Schmidt and W. Plieth

DOI: https://doi.org/10.1051/jphyscol:19831035

ELLIPSOMETRIC INVESTIGATION OF THE SILICON / ANODIC-OXIDE INTERFACE p. C10-179

E.D. Palik and V.M. Bermudez

DOI: https://doi.org/10.1051/jphyscol:19831036

ETUDE "IN SITU" DE LA CROISSANCE D'OXYDE ANODIQUE PAR ELLIPSOMÉTRIE p. C10-183

J. Joseph and A. Gagnaire

DOI: https://doi.org/10.1051/jphyscol:19831037

STUDY OF SURFACES COVERED BY THIN FILMS, BY SPEC AND RAMAN SPECTROSCOPY p. C10-187

M. Froelicher, A. Hugot-Le Goff, V. Jovancicevic, R. Dupeyrat and M. Masson

DOI: https://doi.org/10.1051/jphyscol:19831038

AN IN-SITU REFLECTION-SPECTROSCOPIC STUDY APPLIED TO ANODIC OXIDE FILMS ON IRON, NICKEL, AND TITANIUM p. C10-191

T. Ohtsuka, K. Azumi and N. Sato

DOI: https://doi.org/10.1051/jphyscol:19831039

ELLIPSOMETRE A EPAISSEUR VARIABLE DE FILM APPLICATION TiO₂/Ti p. C10-195

A. Gagnaire and J. Joseph

DOI: https://doi.org/10.1051/jphyscol:19831040

POLYPHASE SUBSTRATE ELLIPSOMETRY - A KINETIC INVESTIGATION p. C10-199

E.F.I. Roberts-Sengier, M.A. Hamilton and R. Hunt

DOI: https://doi.org/10.1051/jphyscol:19831041

GROWTH OF THIN ALUMINA FILM ON ALUMINIUM AT ROOM TEMPERATURE : A KINETIC AND SPECTROSCOPIC STUDY BY SURFACE PLASMON EXCITATION p. C10-205

P. Dumas, J.P. Dubarry-Barbe, D. Rivière, Y. Levy and J. Corset

DOI: https://doi.org/10.1051/jphyscol:19831042

TRANSMITTANCE MEASUREMENTS ON DISCONTINUOUS COPPER FILMS : A SENSITIVE METHOD FOR STUDYING THE OXIDATION PROCESS p. C10-209

P. Picozzi and S. Santucci

DOI: https://doi.org/10.1051/jphyscol:19831043

ELLIPSOMETRY OF NICKEL-OXIDES AND -HYDROXIDES IN ALKALINE ELECTROLYTE p. C10-213

W. Visscher

DOI: https://doi.org/10.1051/jphyscol:19831044

ELLIPSOMETRIC STUDY OF NUCLEATION AND GROWTH IN THE ANODIC FILM FORMATION ON Bi₂ Te₃ p. C10-217

T. Hoshino, A. Moritani and J. Nakai

DOI: https://doi.org/10.1051/jphyscol:19831045

APPLICATION OF ELLIPSOMETRY TO STUDIES OF ELECTROSTRICTION AND ELECTROCHROMISM IN ANODIC OXIDE FILMS p. C10-221

J.L. Ord

DOI: https://doi.org/10.1051/jphyscol:19831046

FURTHER DEVELOPMENT OF THE QUALITATIVE ELLIPSOMETRIC TECHNIQUE FOR THE STUDY OF CORROSION PROCESSES UNDER ORGANIC COATINGS p. C10-225

J.J. Ritter and J. Kruger

DOI: https://doi.org/10.1051/jphyscol:19831047

ELECTROREFLECTANCE AND SPECTROSCOPIC ELLIPSOMETRY STUDIES OF GaAs/GaAlAs HETEROJUNCTIONS p. C10-229

C. Alibert, S. Gaillard, M. Erman and P.M. Frijlink

DOI: https://doi.org/10.1051/jphyscol:19831048

ELECTROREFLECTANCE OF THIN FILM Al-ZnS-Al SANDWICHES p. C10-235

G. Chabrier, A. Moustaide, G. Niquet and P. Vernier

DOI: https://doi.org/10.1051/jphyscol:19831049

ELECTROREFLECTANCE OF THIN ZINC SULFIDE FILMS GROWN BY ATOMIC LAYER EPITAXY AND ELECTRON BEAM EVAPORATION TECHNIQUES p. C10-239

J.A. Lahtinen and T. Tuomi

DOI: https://doi.org/10.1051/jphyscol:19831050

ELLIPSOMETRY OF THIN FILMS ON VAPOR-LIQUID INTERFACES p. C10-243

J.W. Schmidt and M.R. Moldover

DOI: https://doi.org/10.1051/jphyscol:19831051

GROWTH CHARACTERIZATION OF a Si:H FILMS BY MULTIPLE ANGLE OF INCIDENCE SPECTROSCOPIC ELLIPSOMETRY p. C10-247

J. Perrin and B. Drevillon

DOI: https://doi.org/10.1051/jphyscol:19831052

INTERACTIONS OF Si (III) SURFACE WITH H₂, NH₃, SiH₄ MULTIPOLAR PLASMAS STUDIED BY IN SITU ELLIPSOMETRY p. C10-253

Y. Demay, P. Maurel and S. Gourrier

DOI: https://doi.org/10.1051/jphyscol:19831053

ETUDE PAR ELLIPSOMETRIE EN TEMPS REEL D'ANODISATIONS PLASMA DE SILICIUM MONOCRISTALLIN p. C10-257

A. Vareille, A. Straboni, B. Vuillermoz and Ph. Ged

DOI: https://doi.org/10.1051/jphyscol:19831054

SPECTROSCOPIC ELLIPSOMETRY AND RAMAN SCATTERING ANALYSIS OF Be SHALLOW IMPLANTATION IN GaAs p. C10-261

M. Erman, P. Chambon, B. Prévot and C. Schwab

DOI: https://doi.org/10.1051/jphyscol:19831055

EVIDENCE OF STRUCTURAL MODIFICATION OF IMPLANTED SILICON DURING FURNACE ANNEALING p. C10-267

Ph. Ged and M.H. Debroux

DOI: https://doi.org/10.1051/jphyscol:19831056

A NEW ELLIPSOMETRIC PROGRAMME APPLIED TO THE CHARACTERIZATION OF TRANSPARENT CONDUCTING TITANIUM NITRIDE FILMS p. C10-273

G. Celotti, R. Rosa, C. Summonte and G. Martinelli

DOI: https://doi.org/10.1051/jphyscol:19831057

ELECTROMIGRATION IN d.c. ELECTROLUMINESCENT THIN FILMS OF ZnS p. C10-277

G. M. Jakubowska

DOI: https://doi.org/10.1051/jphyscol:19831058

SURFACE ENHANCED RAMAN SCATTERING : AN OVERVIEW OF EXPERIMENTS p. C10-283

R.K. Chang

DOI: https://doi.org/10.1051/jphyscol:19831059

THEORY OF SURFACE ENHANCED RAMAN SCATTERING : A PROSPECTIVE VIEW p. C10-295

M.R. Philpott

DOI: https://doi.org/10.1051/jphyscol:19831060

NON-LOCAL ELECTROMAGNETIC EFFECTS AT METAL SURFACES p. C10-305

S. Lundqvist and P. Apell

DOI: https://doi.org/10.1051/jphyscol:19831061

RAMAN SCATTERING FROM A MOLECULE ADSORBED AT THE METAL SURFACE, THE MOLECULAR CHARGE OSCILLATION MECHANISM p. C10-315

A.G. Mal'shukov

DOI: https://doi.org/10.1051/jphyscol:19831062

RAMAN SIDE-BANDS IN THE REFLECTIVITY FROM METALS DUE TO SURFACE IMPURITIES p. C10-321

T. Maniv

DOI: https://doi.org/10.1051/jphyscol:19831063

SURFACE ENHANCED RAMAN SCATTERING OF ETHYLENE ADSORBED ON VAPOR DEPOSITED SILVER IN UHV, EFFECTS OF THE SILVER FILM THICKNESS AND COVERAGE p. C10-327

A.V. Bobrov, A.N. Gass, O.I. Kapusta and N.M. Omel'yanovskaya

DOI: https://doi.org/10.1051/jphyscol:19831064

THE ROLE OF CHARGE TRANSFER EXCITATIONS BETWEEN SILVER AND PYRIDINE OR CYANIDE IN SURFACE RAMAN ENHANCEMENT p. C10-331

J. Billmann and A. Otto

DOI: https://doi.org/10.1051/jphyscol:19831065

EVIDENCE FOR LOW DENSITY OF ACTIVE SITES IN SURFACE-ENHANCED RAMAN SCATTERING p. C10-333

B. Pettinger and L. Moerl

DOI: https://doi.org/10.1051/jphyscol:19831066

ON THE "FIRST LAYER" ENHANCEMENT IN RAMAN SCATTERING OF PYRIDINE ON SILVER p. C10-337

C. Pettenkofer and A. Otto

DOI: https://doi.org/10.1051/jphyscol:19831067

RAMAN SPECTROSCOPY OF MOLECULES ADSORBED ON SINGLE CRYSTAL METAL SURFACES WITHOUT ENHANCEMENT p. C10-341

A. Campion, V.M. Grizzle, D.R. Mullins and J.K. Brown

DOI: https://doi.org/10.1051/jphyscol:19831068

ELECTROMAGNETICALLY INDUCED CHANGES IN INTENSITIES, SPECTRA, AND TEMPORAL BEHAVIOR OF LIGHT SCATTERING FROM MOLECULES ON SILVER-ISLAND FILMS p. C10-345

S. Garoff, D.A. Weitz, M.S. Alvarez and J.C. Chung

DOI: https://doi.org/10.1051/jphyscol:19831069

ELECTROMAGNETIC THEORY OF ENHANCED NONLINEAR OPTICAL PROCESS p. C10-349

M. Nevière and R. Reinisch

DOI: https://doi.org/10.1051/jphyscol:19831070

INVESTIGATION OF ELECTROMAGNETIC FIELDS AT A ROUGH Ag SURFACE BY DIFFERENTIAL REFLECTOMETRY OF Cu AND Al ADSORBATES p. C10-353

T. López-Ríos, Y. Borensztein and G. Vuye

DOI: https://doi.org/10.1051/jphyscol:19831071

SURFACE PLASMONS ON A RANDOMLY ROUGH SURFACE p. C10-357

G.A. Farias and A.A. Maradudin

DOI: https://doi.org/10.1051/jphyscol:19831072

OPTICAL PROPERTIES OF THIN FILMS ON ROUGH SURFACES p. C10-363

J. Vlieger and M.M. Wind

DOI: https://doi.org/10.1051/jphyscol:19831073

RESTITUTION OF SURFACE PROFILES FROM MICRODENSITOMETER ANALYSIS OF ELECTRON MICROGRAPHS OF SURFACE REPLICAS p. C10-367

G. Rasigni, M. Rasigni, F. Varnier, J.P. Palmari and A. Llebaria

DOI: https://doi.org/10.1051/jphyscol:19831074

NON-LOCAL THEORY FOR THE FAR-INFRARED ABSORPTION IN SMALL METAL PARTICLES p. C10-371

A.G. Mal'shukov

DOI: https://doi.org/10.1051/jphyscol:19831075

QUANTUM-SIZE EFFECTS ON THE OPTICAL PROPERTIES OF SMALL PARTICLES p. C10-375

P. Ahlqvist, P. de Andrés, R. Monreal and F. Flores

DOI: https://doi.org/10.1051/jphyscol:19831076

A STATISTICAL THEORY FOR THE DIELECTRIC PROPERTIES OF THIN ISLAND FILMS, APPLICATION AND COMPARISON WITH EXPERIMENTAL RESULTS p. C10-379

D. Bedeaux and J. Vlieger

DOI: https://doi.org/10.1051/jphyscol:19831077

IMMERSION-TYPE TRANSMISSION ELLIPSOMETRY OF VERY THIN METAL FILMS p. C10-383

M. Yamamoto, K. Ichiji, Y. Wada, K. Takeuchi and K. Kinosita

DOI: https://doi.org/10.1051/jphyscol:19831078

STRUCTURES AND OPTICAL BEHAVIOR OF OVERCOATED GRANULAR FILMS p. C10-387

S. Damaskinos, F.E. Girouard, A. Pinard and V.V. Truong

DOI: https://doi.org/10.1051/jphyscol:19831079

ELLIPSOMETRIC STUDY OF OXYGEN ON A Ag(110) SURFACE AROUND THE PLASMA FREQUENCY OF SILVER p. C10-393

K. Kempa, F. Forstmann, R. Kötz and B.E. Hayden

DOI: https://doi.org/10.1051/jphyscol:19831080

BULK PLASMON RESONANCES IN ELECTROREFLECTANCE SPECTRA OF THIN SILVER LAYERS p. C10-395

F. Forstmann, K. Kempa, G. Piazza and D.M. Kolb

DOI: https://doi.org/10.1051/jphyscol:19831081

NUMERICAL CALCULATION OF THE OPTICAL PROPERTIES OF LINEAR CHAIN SYSTEMS p. C10-397

C. Wijers

DOI: https://doi.org/10.1051/jphyscol:19831082

SPECTROSCOPY OF SURFACE POLARITON DIFFRACTION p. C10-403

V.M. Agranovich, V.E. Kravtsov and T.A. Leskova

DOI: https://doi.org/10.1051/jphyscol:19831083

LATERAL INTERACTIONS IN SMALL PARTICLE SYSTEMS p. C10-409

B.N.J. Persson

DOI: https://doi.org/10.1051/jphyscol:19831084

INFRARED SPECTROSCOPY OF ADSORBED MOLECULES : SOME EXPERIMENTAL ASPECTS p. C10-421

R. Ryberg

DOI: https://doi.org/10.1051/jphyscol:19831085

THE VALENCE ELECTRON EXCITATIONS AND THE OPTICAL PROPERTIES OF ADSORBED ATOMS AND MOLECULES ON METAL SURFACES p. C10-429

E. Burstein, A. Brotman and P. Apell

DOI: https://doi.org/10.1051/jphyscol:19831086

LIGHT REFLECTION BY COMPLEX DYE MONOLAYERS p. C10-441

D. Möbius

DOI: https://doi.org/10.1051/jphyscol:19831087

THE NATURE OF THE EXCITED STATES OF ADSORBATES AND THEIR DECAY MECHANISMS p. C10-451

Ph. Avouris, J.E. Demuth and N.J. DiNardo

DOI: https://doi.org/10.1051/jphyscol:19831088

IR STUDY OF CO CHEMISORBED ON METALLIC Cu DISPERSED IN ZnO p. C10-455

F. Boccuzzi and G. Ghiotti

DOI: https://doi.org/10.1051/jphyscol:19831089

ELLIPSOMETRIC STUDIES OF OXYGEN ADSORBED ON SILVER FILMS p. C10-459

M. Watanabe and P. Wissmann

DOI: https://doi.org/10.1051/jphyscol:19831090

SURFACE ENHANCED RAMAN SPECTRA FROM OXYGEN ON SILVER p. C10-463

C. Pettenkofer, I. Pockrand and A. Otto

DOI: https://doi.org/10.1051/jphyscol:19831091

OXIDATION STUDIES OF THE Be (0001) SURFACE p. C10-465

T.M. Christensen and J.M. Blakely

DOI: https://doi.org/10.1051/jphyscol:19831092

THE BEHAVIOUR OF OXYGEN ON Ni(110) INVESTIGATED BY ELLIPSOMETRY AND AES p. C10-469

L.J. Hanekamp and A. van Silfhout

DOI: https://doi.org/10.1051/jphyscol:19831093

ELLIPSOMETRIC STUDY OF THE CLEAVED GERMANIUM (111) SURFACE AS A FUNCTION OF TEMPERATURE p. C10-473

G. Quentel and R. Kern

DOI: https://doi.org/10.1051/jphyscol:19831094

COMPARATIVE STUDY OF THE OPTICAL PROPERTIES OF SILVER CLUSTERS AND SILVER CONTINUOUS OVERLAYERS ON ALUMINIUM SUBSTRATE BY DIFFERENTIAL REFLECTOMETRY p. C10-475

Y. Borensztein, T. López-Ríos and G. Vuye

DOI: https://doi.org/10.1051/jphyscol:19831095

MONOLAYER SURFACE RAMAN AND FLUORESCENCE SPECTROSCOPY OF THE ANTHRACENE CRYSTAL p. C10-479

M. Orrit, J. Bernard, J.M. Turlet and Ph. Kottis

DOI: https://doi.org/10.1051/jphyscol:19831096

SURFACE-ENHANCED RAMAN STUDIES OF THE LIQUID/SOLID INTERFACE p. C10-483

S. Garoff and C.J. Sandroff

DOI: https://doi.org/10.1051/jphyscol:19831097

THE SHORT-RANGE COMPONENT OF SERS : RESULTS OF BIOPOLYMERS p. C10-487

E. Koglin and J.M. Séquaris

DOI: https://doi.org/10.1051/jphyscol:19831098

ELLIPSOMETRIC MEASUREMENT OF THE ASSOCIATION OF PROTHROMBIN WITH PHOSPHOLIPID MONOLAYERS p. C10-491

J.M.M. Kop, J.W. Corsel, M.P. Janssen, P.A. Cuypers and W.Th. Hermens

DOI: https://doi.org/10.1051/jphyscol:19831099

ELLIPSOMETRIC MEASUREMENT OF THE SPECIFIC VOLUMES OF PHOSPHOLIPIDS AND PROTEINS AT SOLID-WATER INTERFACES p. C10-495

P.A. Cuypers, J.W. Corsel, J.M.M. Kop, M.P. Janssen and W.Th. Hermens

DOI: https://doi.org/10.1051/jphyscol:198310100

ELLIPSOMETRIC QUANTIFICATION OF ANTIGEN-ANTIBODY PRECIPITATES ADSORBED ON ANTIGEN-COATED SILICON SURFACES. A NEW PRINCIPLE FOR IMMUNOCHEMICAL ANALYSIS p. C10-499

H. Elwing, A. Palmqvist and A. Askendal

DOI: https://doi.org/10.1051/jphyscol:198310101

RAMAN SPECTROSCOPY IN GUIDED OPTICAL WAVES p. C10-501

J.D. Swalen and J.F. Rabolt

DOI: https://doi.org/10.1051/jphyscol:198310102

ELLIPSOMETRY IN ABSORBING SOLUTIONS p. C10-505

R. Greef and P.J. Pearson

DOI: https://doi.org/10.1051/jphyscol:198310103

ELLIPSOMETRIC STUDY OF ACRYLONITRILE ELECTROPOLYMERISATION ON NICKEL p. C10-509

Y. Bouizem, F. Chao, M. Costa and A. Tadjeddine

DOI: https://doi.org/10.1051/jphyscol:198310104

APPLICATION OF THE VISIBLE ELECTROREFLECTANCE SPECTROSCOPY TO THE CHARACTERIZATION OF PROCESSES OCCURRING ON GOLD ELECTRODES p. C10-513

C. Nguyen Van Huong and C. Hinnen

DOI: https://doi.org/10.1051/jphyscol:198310105

IN SITU IR-ATR-SPECTROSCOPY OF ELECTRODE SURFACES p. C10-517

H. Neugebauer, A. Neckel, G. Nauer, N. Brinda-Konopik, F. Garnier and G. Tourillon

DOI: https://doi.org/10.1051/jphyscol:198310106

ELLIPSOMETRIC STUDIES OF BIOLOGICAL MACROMOLECULES p. C10-521

K. Toth, G. Vuye, H. Vainer, Gy. Ronto and D. Aslanian

DOI: https://doi.org/10.1051/jphyscol:198310107

Le Journal de Physique Colloques

Volume 44 / No C10 (Décembre 1983)

Conférence Internationale sur Ellipsométrie et autres Méthodes Optiques pour l'Analyse des Surfaces et Films Minces / Ellipsometry and other Optical Methods for Surface and Thin Film Analysis