Numéro
J. Phys. Colloques
Volume 47, Numéro C7, Novembre 1986
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
Page(s) C7-509 - C7-513
DOI https://doi.org/10.1051/jphyscol:1986785
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ

J. Phys. Colloques 47 (1986) C7-509-C7-513

DOI: 10.1051/jphyscol:1986785

DETECTION EFFICIENCY OF FLARED-TYPE MICRO CHANNELPLATES APPLIED FOR ToF ATOM-PROBE FIM

Y. HASEGAWA1, T. HASHIZUME2, T. SAKURAI1 et Y. MIZUSHIMA3

1  The Institute for Solid State Physics (ISSP), The University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106, Japan
2  AT & T Bell Laboratories, Murray Hill, N.J. 07974. Japan
3  Hamamatsu Photonics K.K., 1126 Ichino-cho, Hamamatsu, Japan


Abstract
A detection efficiency of a flared-type micro channelplate (70% open surface area) was measured using the time-of-flight atom-probe which had an 100% detection efficiency. The efficiency was found to be 66 ± 7%, higher than that (approximately 60%) of a regular channelplate, but not as high as that expected from the increased aperture size.