| Numéro |
J. Phys. Colloques
Volume 47, Numéro C2, Mars 1986
32 nd International Field Emission Symposium / 32ème Symposium International d'Emission de Champ
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| Page(s) | C2-425 - C2-430 | |
| DOI | https://doi.org/10.1051/jphyscol:1986265 | |
32 nd International Field Emission Symposium / 32ème Symposium International d'Emission de Champ
J. Phys. Colloques 47 (1986) C2-425-C2-430
DOI: 10.1051/jphyscol:1986265
The Institute for Solid State Physics, The University of Tokyo, Roppongi, Minato-ku, Tokyo 106, Japan
J. Phys. Colloques 47 (1986) C2-425-C2-430
DOI: 10.1051/jphyscol:1986265
THE ABSOLUTE DETECTION EFFICIENCY OF A CHANNELPLATE ELECTRON MULTIPLIER
T. HASHIZUME et T. SAKURAIThe Institute for Solid State Physics, The University of Tokyo, Roppongi, Minato-ku, Tokyo 106, Japan
Abstract
Making use of the high-performance focusing-type ToF atom-probe, we have examined detection efficiency of a micro-channelplate on an absolute scale. The detection efficiency for single ion impacts is approximately 60%, close to the fraction of the active channel area of the surface. It may increase slightly, but no more than a few percent contrary to Panitz's clame, even the front surface is positively biased.