J. Phys. Colloques
Volume 50, Numéro C8, Novembre 198936th International Field Emission Symposium
|Page(s)||C8-555 - C8-560|
J. Phys. Colloques 50 (1989) C8-555-C8-560
AN ADVANCED TECHNIQUE FOR THE PREPARATION AND TEM EXAMINATION OF FIM SPECIMENSP.E. FISCHIONE1, J.J. HAUGH2 et M.G. BURKE2
1 E.A. Fischione Instrument Manufacturing, Pittsburgh, PA 15239, U.S.A.
2 Westinghouse Science and Technology Center, Pittsburgh, PA 15235, U.S.A.
A newly-developed FIM/FEM Polisher and TEM holder have been used to successfully prepare and examine FIM specimens. These instruments incorporate many user-oriented features, the design aspects of which are discussed. An example illustrating the preparation and examination of an A533B steel specimen is presented.