| Numéro |
J. Phys. Colloques
Volume 47, Numéro C7, Novembre 1986
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
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|---|---|---|
| Page(s) | C7-449 - C7-452 | |
| DOI | https://doi.org/10.1051/jphyscol:1986775 | |
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
J. Phys. Colloques 47 (1986) C7-449-C7-452
DOI: 10.1051/jphyscol:1986775
Department of Physics, Chalmers University of Technology, S-412 96 Göteborg, Sweden
J. Phys. Colloques 47 (1986) C7-449-C7-452
DOI: 10.1051/jphyscol:1986775
A METHOD FOR SHARPENING FIM-SPECIMENS
U. ROLANDERDepartment of Physics, Chalmers University of Technology, S-412 96 Göteborg, Sweden
Abstract
A method is presented which makes it possible both to sharpen also extremely blunt specimens and to perform controlled back polishing without making the specimens blunter. The method seems to have quite general applications. It has been applied to such different materials as TiC-Ni-based and WC-Co-based cemented carbides, low alloyed and high alloyed steels, low alloyed zirconium and pure titanium.