| Numéro |
J. Phys. Colloques
Volume 50, Numéro C8, Novembre 1989
36th International Field Emission Symposium
|
|
|---|---|---|
| Page(s) | C8-223 - C8-228 | |
| DOI | https://doi.org/10.1051/jphyscol:1989838 | |
36th International Field Emission Symposium
J. Phys. Colloques 50 (1989) C8-223-C8-228
DOI: 10.1051/jphyscol:1989838
1 CRMC2-CNRS, Campus de Luminy, F-13288 Marseille, France
2 Physics Department, Dalhouse University, Halifax, Nova Scotia, Canada
J. Phys. Colloques 50 (1989) C8-223-C8-228
DOI: 10.1051/jphyscol:1989838
A MEASUREMENT OF A SURFACE SELF-DIFFUSION COEFFICIENT BY SCANNING TUNNELING MICROSCOPY
M. DRECHSLER1, B.L. BLACKFORD2, A.M. PUTNAM2 et M.H. JERICHO21 CRMC2-CNRS, Campus de Luminy, F-13288 Marseille, France
2 Physics Department, Dalhouse University, Halifax, Nova Scotia, Canada
Abstract
A technique is described to measure a surface self-diffusion coefficient (D) of a metal (gold) by scanning tunneling microscopy. Micro-hills formed on a gold face show a shape evolution by a diffusion transport of kink site atoms. D is determined via a measurement of the hill apex radius as a function of time and includes corrections of image errors. The technique shows that STM can be used to study diffusion and it opens the possibility of measuring diffusion at lower temperatures where D could not be measured previously.