Numéro
J. Phys. Colloques
Volume 50, Numéro C8, Novembre 1989
36th International Field Emission Symposium
Page(s) C8-235 - C8-240
DOI https://doi.org/10.1051/jphyscol:1989840
36th International Field Emission Symposium

J. Phys. Colloques 50 (1989) C8-235-C8-240

DOI: 10.1051/jphyscol:1989840

DIRECT TIP STRUCTURES DETERMINATION BY SCANNING TUNNELING MICROSCOPY

R. GARCÍA CANTÚ et M.A. HUERTA GARNICA

Centro de Investigación y de Estudios Avanzados del IPN, Departamento de Ingeniería Eléctrica. Sección de Metrología, Apartado Postal 14-740, 07000 México, D.F., México


Abstract
An electrochemical etched scanning tunneling microscope tip is studied, using a long scan tunneling microscope and scanning electron microscopy, in order to characterize the neighborhood of the tip apex. Observed microstructure and protrusions are discussed in relation to chemical etching and mechanical resistance.