| Numéro |
J. Phys. Colloques
Volume 49, Numéro C6, Novembre 1988
35th International Field Emission Symposium / 35éme Symposium International d'Emission de Champ
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| Page(s) | C6-75 - C6-80 | |
| DOI | https://doi.org/10.1051/jphyscol:1988613 | |
J. Phys. Colloques 49 (1988) C6-75-C6-80
DOI: 10.1051/jphyscol:1988613
KINETIC ENERGY AND MASS ANALYSIS OF COVALENT GROUP IV CLUSTER IONS IN PULSED-LASER STIMULATED FIELD EVAPORATION
T.T. TSONG et J. LIUPhysics Department, The Pensylvania State University, University Park, Pennsylvania, PA 16802, U.S.A.
Abstract
Multiply charged cluster ions of silicon and carbon can be formed in pulsed-laser stimulated field evaporation. In general, the signal intensity decreases monotonically with the cluster size. However, a few cluster ion species stand out ; these are species of greater stability. For Si, they are Si42+ and Si62+, and for C they are C3+ and C5+. While Si field evaporates mostly as 2+ cluster ions, C field evaporates mostly as 1+ cluster ions. There is, however, a small fraction of 2+ and 3+ C-cluster ions. For 3+ C-cluster ions, the intensity is smaller for smaller cluster ion species, indicating the occurrence of Coulomb repulsive dissociation. The different stabilities observed for Si and C clusters are in good agreement with theoretical calculations.