| Numéro |
J. Phys. Colloques
Volume 49, Numéro C6, Novembre 1988
35th International Field Emission Symposium / 35éme Symposium International d'Emission de Champ
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| Page(s) | C6-49 - C6-53 | |
| DOI | https://doi.org/10.1051/jphyscol:1988609 | |
35th International Field Emission Symposium / 35éme Symposium International d'Emission de Champ
J. Phys. Colloques 49 (1988) C6-49-C6-53
DOI: 10.1051/jphyscol:1988609
1 Oak Ridge National Laboratory, Oak Ridge, TN 37831-6142, U.S.A.
2 State University of New York, Fredonia, NY 14063, U.S.A.
J. Phys. Colloques 49 (1988) C6-49-C6-53
DOI: 10.1051/jphyscol:1988609
SURFACE IMAGING BY POSITRON EMISSION
L.D. HULETT1, Jr.1, D.L. DONOHUE1 et S. PENDYALA21 Oak Ridge National Laboratory, Oak Ridge, TN 37831-6142, U.S.A.
2 State University of New York, Fredonia, NY 14063, U.S.A.
Abstract
Monoenergetic ("slow") positrons are becoming available in the form of beams having brightness sufficiently high for use in microscope and microprobe applications. When slow positrons are injected into certain solid materials they are re-emitted without need for an externally applied extraction field. This property suggests that a positron emission microscope will have useful capabilities and be less severely impaired by problems that extraction fields impose on electron emission devices. The principles involved in a positron emission microscope are discussed, and an estimate of resolutions that might be achieved in the near future is made.