| Numéro |
J. Phys. Colloques
Volume 48, Numéro C9, Décembre 1987
X-Ray and Inner-Shell ProcessesVol. 1 |
|
|---|---|---|
| Page(s) | C9-935 - C9-938 | |
| DOI | https://doi.org/10.1051/jphyscol:19879167 | |
X-Ray and Inner-Shell Processes
Vol. 1
J. Phys. Colloques 48 (1987) C9-935-C9-938
DOI: 10.1051/jphyscol:19879167
1 Sektion Physik, Ludwig-Maximilians Universität München, D-8000 München 22, F.R.G.
2 Institute of Physics, Polish Academy of Sciences, PL-02 668 Warsaw, Poland
Vol. 1
J. Phys. Colloques 48 (1987) C9-935-C9-938
DOI: 10.1051/jphyscol:19879167
DEPTH DISTRIBUTION OF CHARACTERISTIC X-RAYS OF NICKEL AND COPPER EXCITED BY ELECTRON BOMBARDMENT
G. WIECH1 and W. ZAHOROWSKI21 Sektion Physik, Ludwig-Maximilians Universität München, D-8000 München 22, F.R.G.
2 Institute of Physics, Polish Academy of Sciences, PL-02 668 Warsaw, Poland
Abstract
The peak intensity of the Ni Lα and the Cu Kα lines excited by electron bombardment was measured as a function of the thickness of the target and at different incident electron energies. The results are compared with calculations based on a Gaussian expression describing the depth distribution of x-ray production.