J. Phys. Colloques
Volume 48, Numéro C9, Décembre 1987X-Ray and Inner-Shell Processes
|Page(s)||C8-679 - C8-692|
J. Phys. Colloques 48 (1987) C8-679-C8-692
CORE HOLE DECAY AND FRAGMENTATION OF MOLECULES ; ELECTRON-ION COINCIDENCE STUDIES OF N2W. EBERHARDT1, E.W. PLUMMER2, I.-W. LYO2, R. MURPHY2, R. CARR3 and W.K. FORD4
1 Exxon Research and Engineering Company, Route 22E, Annandale, NJ 08801, U.S.A.
2 University of Pennsylvania, Department of Physics, Philadelphia, PA 19104, U.S.A.
3 SSRL, PO Box 4349, Bin 69, Stanford, CA 94305, U.S.A.
4 Montana State University, Physics Department, Bozeman, MT 59717, U.S.A.
Coincidence studies between energy selected electrons and the ions produced in the decay of a core hole excited state in free molecules reveal the individual pathways of soft x-ray induced fragmentation processes. In this type of measurement it is possible to correlate the ion fragmentation products, their kinetic energy and electronic configuration with the hole configuration in the singly or doubly charged molecular electronic states populated in the electronic decay of the initial core hole excited state. This data produces a new insight into the potential energy curves of the singly and doubly charged molecular ions and into energy dissipation in highly excited molecular systems.