Numéro
J. Phys. Colloques
Volume 48, Numéro C9, Décembre 1987
X-Ray and Inner-Shell Processes
Vol. 1
Page(s) C8-679 - C8-692
DOI https://doi.org/10.1051/jphyscol:19879118
X-Ray and Inner-Shell Processes
Vol. 1

J. Phys. Colloques 48 (1987) C8-679-C8-692

DOI: 10.1051/jphyscol:19879118

CORE HOLE DECAY AND FRAGMENTATION OF MOLECULES ; ELECTRON-ION COINCIDENCE STUDIES OF N2

W. EBERHARDT1, E.W. PLUMMER2, I.-W. LYO2, R. MURPHY2, R. CARR3 and W.K. FORD4

1  Exxon Research and Engineering Company, Route 22E, Annandale, NJ 08801, U.S.A.
2  University of Pennsylvania, Department of Physics, Philadelphia, PA 19104, U.S.A.
3  SSRL, PO Box 4349, Bin 69, Stanford, CA 94305, U.S.A.
4  Montana State University, Physics Department, Bozeman, MT 59717, U.S.A.


Abstract
Coincidence studies between energy selected electrons and the ions produced in the decay of a core hole excited state in free molecules reveal the individual pathways of soft x-ray induced fragmentation processes. In this type of measurement it is possible to correlate the ion fragmentation products, their kinetic energy and electronic configuration with the hole configuration in the singly or doubly charged molecular electronic states populated in the electronic decay of the initial core hole excited state. This data produces a new insight into the potential energy curves of the singly and doubly charged molecular ions and into energy dissipation in highly excited molecular systems.