| Numéro |
J. Phys. Colloques
Volume 48, Numéro C6, Novembre 1987
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
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| Page(s) | C6-565 - C6-570 | |
| DOI | https://doi.org/10.1051/jphyscol:1987692 | |
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
J. Phys. Colloques 48 (1987) C6-565-C6-570
DOI: 10.1051/jphyscol:1987692
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6376, U.S.A.
J. Phys. Colloques 48 (1987) C6-565-C6-570
DOI: 10.1051/jphyscol:1987692
THE EFFECTS OF LOCAL MAGNIFICATION AND TRAJECTORY ABERRATIONS ON ATOM PROBE ANALYSIS
M.K. MillerMetals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6376, U.S.A.
Abstract
The effects of the difference in local magnification between phase and trajectory aberrations at interfaces and boundaries on atom probe and imaging atom probe analysis has been investigated using field-ion and ungated desorption micrographs. Local magnification differences of 2 to 5 times between phases were measured in Fe-Cr and Fe-Cu alloys. Significant trajectory aberrations at interphase interfaces and grain boundaries were also detected. The influence of these effects on the quantification of atom probe and imaging atom probe analyses is discussed.