J. Phys. Colloques
Volume 48, Numéro C6, Novembre 198734th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
|C6-565 - C6-570
J. Phys. Colloques 48 (1987) C6-565-C6-570
THE EFFECTS OF LOCAL MAGNIFICATION AND TRAJECTORY ABERRATIONS ON ATOM PROBE ANALYSISM.K. Miller
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6376, U.S.A.
The effects of the difference in local magnification between phase and trajectory aberrations at interfaces and boundaries on atom probe and imaging atom probe analysis has been investigated using field-ion and ungated desorption micrographs. Local magnification differences of 2 to 5 times between phases were measured in Fe-Cr and Fe-Cu alloys. Significant trajectory aberrations at interphase interfaces and grain boundaries were also detected. The influence of these effects on the quantification of atom probe and imaging atom probe analyses is discussed.