| Numéro |
J. Phys. Colloques
Volume 48, Numéro C6, Novembre 1987
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
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| Page(s) | C6-559 - C6-564 | |
| DOI | https://doi.org/10.1051/jphyscol:1987691 | |
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
J. Phys. Colloques 48 (1987) C6-559-C6-564
DOI: 10.1051/jphyscol:1987691
1 Department of Metallurgy and Science of Materials, University of Oxford, Oxford OX1 3PH, U.K.
2 Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, U.S.A.
J. Phys. Colloques 48 (1987) C6-559-C6-564
DOI: 10.1051/jphyscol:1987691
ON THE STATISTICAL ANALYSIS OF ATOM PROBE DATA
M.G. Hetherington1 et M.K. Miller21 Department of Metallurgy and Science of Materials, University of Oxford, Oxford OX1 3PH, U.K.
2 Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, U.S.A.
Abstract
The statistical techniques that have been applied for presenting and analyzing atom probe data are critiqued. These techniques include raw data analysis, character plots, ladder diagrams, frequency distributions of composition profiles, Markov chains, contingency tables, cross correlations, power spectrum, and autocorrelations. A comparison of the suitability of the individual techniques for specific metallurgical applications is also presented.