| Numéro |
J. Phys. Colloques
Volume 48, Numéro C6, Novembre 1987
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
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|---|---|---|
| Page(s) | C6-525 - C6-530 | |
| DOI | https://doi.org/10.1051/jphyscol:1987686 | |
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
J. Phys. Colloques 48 (1987) C6-525-C6-530
DOI: 10.1051/jphyscol:1987686
Department of Physics, Tokyo Institute of Technology, Oh-okayama, Meguro-ku, Tokyo 152, Japan
J. Phys. Colloques 48 (1987) C6-525-C6-530
DOI: 10.1051/jphyscol:1987686
MICROSCOPY : A MEANS TO STUDY SURFACE STRUCTURES
K. Takayanagi, Y. Tanishiro et K. MurookaDepartment of Physics, Tokyo Institute of Technology, Oh-okayama, Meguro-ku, Tokyo 152, Japan
Abstract
High-resolution UHV electron microscopy of surfaces and clusters in transmission (TEM) mode has revealed dynamic behavior of surfaces and clusters at atomic-level resolution using videotape recording. Validity and limitation of the electron microscopy are discussed and future instrumental developments for atomic level structure analysis, combination of EM and FIM, is suggested.