J. Phys. Colloques
Volume 48, Numéro C6, Novembre 198734th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
|Page(s)||C6-115 - C6-120|
J. Phys. Colloques 48 (1987) C6-115-C6-120
STUDY OF FIELD INDUCED HOT-ELECTRON EMISSION USING THE COMPOSITE MICROEMITTERS WITH VARYING DIELECTRIC LAYER THICKNESSM.S. Mousa
Department of Natural Sciences, P.O. Box 7, Mu'tah University, Al-Karak, Jordan
The analysis of the measurements obtained from the of field emission of electrons from composite metal-insulator (M-I) micropoint cathodes, using the combination of a high resolution electron spectrometer and a field emission microscope, has been presented. Results obtained describe the reversible current-voltage characteristic, emission images and electron energy distribution measurements of both thin and the optimum thick coatings. The observed effects, e.g. the threshold switch-on phenomena and the field-dependence of the F.W.H.M. and energy shift of the electron spectra have been identified in terms of a field-induced hot-electron emission (FIHEE) mechanism resulting from field penetration in the insulating film where conducting channels are formed. The theoretical implications accounts for the channels field intensification mechanism and the conduction properties with applied field, and the F.W.H.M. dependence on electron temperature. The control of the emission process at low fields by the M-I contact junction and at high fields by the bulk properties of the insulator have also been accounted for. These experimental and theoretical findings have been shown to be consistent with recently published data on M-I microstructures on broad-area (BA) high-voltage electrodes.