| Numéro |
J. Phys. Colloques
Volume 47, Numéro C7, Novembre 1986
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
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|---|---|---|
| Page(s) | C7-139 - C7-144 | |
| DOI | https://doi.org/10.1051/jphyscol:1986725 | |
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
J. Phys. Colloques 47 (1986) C7-139-C7-144
DOI: 10.1051/jphyscol:1986725
1 Mu'tah University, Al-Karak, Jordan
2 Aston University, GB-Birmingham B4 7ET, Great-Britain
J. Phys. Colloques 47 (1986) C7-139-C7-144
DOI: 10.1051/jphyscol:1986725
HOT-ELECTRON EMISSION FROM COMPOSITE METAL-INSULATOR MICROEMITTERS
M.S. MOUSA1 et R.V. LATHAM21 Mu'tah University, Al-Karak, Jordan
2 Aston University, GB-Birmingham B4 7ET, Great-Britain
Abstract
Field emission microscopy and electron spectroscopy have been used to study the emission characteristics of several types of metal-insulator microemitters : these include resin-, alumina-, and hydrocarbon-coated tungsten, and glass-coated silver structures. Details are given of the threshold switch-on phenomenon, the reversible current-voltage characteristic, the high-field saturated emission current, the emission image, and the field-dependence of the spectral shift and FWHM. Consideration is also given to the technological significance of these findings.