| Numéro |
J. Phys. Colloques
Volume 47, Numéro C8, Décembre 1986
EXAFS and Near Edge Structure IV
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|---|---|---|
| Page(s) | C8-67 - C8-70 | |
| DOI | https://doi.org/10.1051/jphyscol:1986810 | |
EXAFS and Near Edge Structure IV
J. Phys. Colloques 47 (1986) C8-67-C8-70
DOI: 10.1051/jphyscol:1986810
Department of Physics, FM-15, University of Washington, Seattle, WA 98195, U.S.A.
J. Phys. Colloques 47 (1986) C8-67-C8-70
DOI: 10.1051/jphyscol:1986810
SEMICLASSICAL TREATMENT FOR INELASTIC PROCESSES IN EXAFS
D. LU et J.J. REHRDepartment of Physics, FM-15, University of Washington, Seattle, WA 98195, U.S.A.
Abstract
Inelastic processes in EXAFS (extended x-ray absorption fine structure) are studied using an extension of the semiclassical model of dynamical screening of a core hole and a photoelectron. This treatment effectively includes both extrinsic and intrinsic inelastic losses as well as interference between them. A complex, energy-dependent potential which accounts for these inelastic effects is derived. This potential is compared with static final state potentials and with empirically determined mean free paths. An local relaxation method is developed to calculate the core hole Green's function in an inhomogeneous system. Application is made to the EXAFS amplitude of the diatomic molecule Br2.