| Numéro |
J. Phys. Colloques
Volume 47, Numéro C5, Août 1986
International Workshop on Evaluation of Single-Crystal Diffraction Data from 2-D Position-Sensitive Detectors
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|---|---|---|
| Page(s) | C5-137 - C5-142 | |
| DOI | https://doi.org/10.1051/jphyscol:1986518 | |
International Workshop on Evaluation of Single-Crystal Diffraction Data from 2-D Position-Sensitive Detectors
J. Phys. Colloques 47 (1986) C5-137-C5-142
DOI: 10.1051/jphyscol:1986518
Chemistry and Materials Science and Technology Divisions, Argonne National Laboratory, Argonne, Illinois 60439, U.S.A.
J. Phys. Colloques 47 (1986) C5-137-C5-142
DOI: 10.1051/jphyscol:1986518
ANALYSIS OF SPALLATION TIME-OF-FLIGHT (TOF) NEUTRON DATA FROM A 2-D POSITION-SENSITIVE DETECTOR
A.J. SCHULTZ et P.C.W. LEUNGChemistry and Materials Science and Technology Divisions, Argonne National Laboratory, Argonne, Illinois 60439, U.S.A.
Abstract
The single crystal diffractometer at the Argonne Intense Pulsed Neutron Source is based on the time-of-flight (TOF) Laue technique and employs a 30 x 30 cm. position-sensitive scintillation detector. The methods we use for producing reciprocal space intensity plots and for obtaining integrated structure factor amplitudes will be described.