Numéro
J. Phys. Colloques
Volume 47, Numéro C5, Août 1986
International Workshop on Evaluation of Single-Crystal Diffraction Data from 2-D Position-Sensitive Detectors
Page(s) C5-137 - C5-142
DOI https://doi.org/10.1051/jphyscol:1986518
International Workshop on Evaluation of Single-Crystal Diffraction Data from 2-D Position-Sensitive Detectors

J. Phys. Colloques 47 (1986) C5-137-C5-142

DOI: 10.1051/jphyscol:1986518

ANALYSIS OF SPALLATION TIME-OF-FLIGHT (TOF) NEUTRON DATA FROM A 2-D POSITION-SENSITIVE DETECTOR

A.J. SCHULTZ et P.C.W. LEUNG

Chemistry and Materials Science and Technology Divisions, Argonne National Laboratory, Argonne, Illinois 60439, U.S.A.


Abstract
The single crystal diffractometer at the Argonne Intense Pulsed Neutron Source is based on the time-of-flight (TOF) Laue technique and employs a 30 x 30 cm. position-sensitive scintillation detector. The methods we use for producing reciprocal space intensity plots and for obtaining integrated structure factor amplitudes will be described.