| Numéro |
J. Phys. Colloques
Volume 47, Numéro C2, Mars 1986
32 nd International Field Emission Symposium / 32ème Symposium International d'Emission de Champ
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|---|---|---|
| Page(s) | C2-73 - C2-77 | |
| DOI | https://doi.org/10.1051/jphyscol:1986211 | |
32 nd International Field Emission Symposium / 32ème Symposium International d'Emission de Champ
J. Phys. Colloques 47 (1986) C2-73-C2-77
DOI: 10.1051/jphyscol:1986211
Department of Mathematics and Physics, University of Aston, GB-Birmingham B4 7ET, Great Britain
J. Phys. Colloques 47 (1986) C2-73-C2-77
DOI: 10.1051/jphyscol:1986211
II. THERMAL AND PHOTO-ASSISTED HOT-ELECTRON EMISSION FROM MIM MICRO-STRUCTURES
N.S. XU et R.V. LATHAMDepartment of Mathematics and Physics, University of Aston, GB-Birmingham B4 7ET, Great Britain
Abstract
A high resolution electron spectrometer has been used to demonstrate experimentally that both thermal (T varying from ~300-700 K) and photo (λ ~350nm) stimulation can enhance the field-induced hot-electron emission from a metal-insulator-metal (MIM) microstructure. A detailed analysis of electron energy spectra has provided relationships between temperature and such emission parameters as current, spectral half-width and spectral shift. These studies have also provided valuable information about electron transport in the MIM structure and the electron energy distribution in the metal-insulator interface in immediate proximity to the vacuum.