| Numéro |
J. Phys. Colloques
Volume 46, Numéro C8, Décembre 1985
Third International Conference on the Structure of Non-Crystalline Materials
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|---|---|---|
| Page(s) | C8-293 - C8-297 | |
| DOI | https://doi.org/10.1051/jphyscol:1985843 | |
Third International Conference on the Structure of Non-Crystalline Materials
J. Phys. Colloques 46 (1985) C8-293-C8-297
DOI: 10.1051/jphyscol:1985843
Research Institute of Mineral Dressing and Metallurgy (SENKEN), Tohoku University, Sendai 980, Japan
J. Phys. Colloques 46 (1985) C8-293-C8-297
DOI: 10.1051/jphyscol:1985843
STRUCTURAL CHARACTERIZATION OF NON-CRYSTALLINE MATERIALS BY THE ANOMALOUS (RESONANCE) X-RAY SCATTERING
Y. WasedaResearch Institute of Mineral Dressing and Metallurgy (SENKEN), Tohoku University, Sendai 980, Japan
Résumé
La diffusion anomale des rayons X associée à l'utilisation d'une source blanche intense est décrite et ses mérites analysés en relation avec le problème de l'ordre chimique à courte distance dans les matériaux non-cristallins.
Abstract
The relative merit of the anomalous x-ray scattering and its potential power coupled with a white x-ray source has been described with respect to the determination of the local chemical environment around a specific atom as a function of radial distance in non-crystalline materials with sufficient reliability.