Issue
J. Phys. Colloques
Volume 46, Number C8, Décembre 1985
Third International Conference on the Structure of Non-Crystalline Materials
Page(s) C8-293 - C8-297
DOI https://doi.org/10.1051/jphyscol:1985843
Third International Conference on the Structure of Non-Crystalline Materials

J. Phys. Colloques 46 (1985) C8-293-C8-297

DOI: 10.1051/jphyscol:1985843

STRUCTURAL CHARACTERIZATION OF NON-CRYSTALLINE MATERIALS BY THE ANOMALOUS (RESONANCE) X-RAY SCATTERING

Y. Waseda

Research Institute of Mineral Dressing and Metallurgy (SENKEN), Tohoku University, Sendai 980, Japan


Résumé
La diffusion anomale des rayons X associée à l'utilisation d'une source blanche intense est décrite et ses mérites analysés en relation avec le problème de l'ordre chimique à courte distance dans les matériaux non-cristallins.


Abstract
The relative merit of the anomalous x-ray scattering and its potential power coupled with a white x-ray source has been described with respect to the determination of the local chemical environment around a specific atom as a function of radial distance in non-crystalline materials with sufficient reliability.