J. Phys. Colloques
Volume 42, Numéro C4, Octobre 1981Proceedings of the Ninth International Conference on Amorphous and Liquid Semiconductors
|Page(s)||C4-617 - C4-620|
J. Phys. Colloques 42 (1981) C4-617-C4-620
MEASUREMENT AND ANALYSIS OF CURRENT TRANSIENTS IN WELL-CHARACTERIZED a-Si:HM.J. Thompson1, N.M. Johnson2 and R.A. Street2
1 Dept. of Elec. Eng., University of Sheffield, England
2 Xerox Palo Alto Research Centers, Palo Alto, CA 94304, U.S.A.
Deep-level current transient spectroscopy (DLTS) and thermally stimulated current measurements have been performed on a-Si:H Schottky barriers over a temperature range of 10 - 300K. Current injection and photoexcitation have been used to accomplish trap filling. The voltage dependence of the transient current in DLTS spectra is presented, and the contribution from interface states was found to be negligible. Deep levels have been studied in a wide range of a-Si:H material with spin densities varying from 1015 - 3 x 1017 cm-3. The contributions to the current transient spectra from carrier transport and thermal emission from deep traps are evaluated.