Numéro |
J. Phys. Colloques
Volume 34, Numéro C6, Novembre 1973
CONGRÈS DU CENTENAIRE DE LA SOCIÉTÉ FRANÇAISE DE PHYSIQUEPROPRIÉTÉS PHOTOÉMISSIVES DES SOLIDES |
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Page(s) | C6-95 - C6-95 | |
DOI | https://doi.org/10.1051/jphyscol:1973624 |
PROPRIÉTÉS PHOTOÉMISSIVES DES SOLIDES
J. Phys. Colloques 34 (1973) C6-95-C6-95
DOI: 10.1051/jphyscol:1973624
PHOTOEMISSION FROM THE DECAY OF SURFACE PLASMONS IN THIN FILMS OF Al
T. A. CALLCOTT and E. T. ARAKAWA (Tennessee)University of Tennessee and Oak Ridge National Laboratory, Oak Ridge, USA
Abstract
We have measured the yields and energy distributions of electrons generated by the decay of non-radiating surface plasmons in thin Al films. The films are evaporated onto the flat surface of a MgF2 semi-cylinder. Plasmons are generated at the vacuum interface of the film by light obliquely incident on the film through the substrate. Excitation of the plasmon modes occurs for a very narrow range of incident light angles. Reflection measurements as a function of angle show a sharp dip at this angle. Photoyields show a corresponding maximum as reported by Macek et al. [1]. Our measurements extend over a wider range of photon energies (4-10 eV) and include measurements of the energy distributions (EDC's) of both "on-peak" and "offpeak" photoemission. "On peak" EDC's are indistinguishable from those obtained with light incident on the film from the vacuum. "Off-peak" EDC's show an excess of low energy electrons. The results are accounted for in terms of the distribution of electric field intensities in the Al film.