| Issue |
J. Phys. Colloques
Volume 49, Number C6, Novembre 1988
35th International Field Emission Symposium / 35éme Symposium International d'Emission de Champ
|
|
|---|---|---|
| Page(s) | C6-405 - C6-410 | |
| DOI | https://doi.org/10.1051/jphyscol:1988669 | |
35th International Field Emission Symposium / 35éme Symposium International d'Emission de Champ
J. Phys. Colloques 49 (1988) C6-405-C6-410
DOI: 10.1051/jphyscol:1988669
1 Solid State Division, Oak Ridge National Laboratory, Building 5500, PO Box 2008, Oak Ridge, TN 37831-6377, U.S.A.
2 Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, U.S.A.
J. Phys. Colloques 49 (1988) C6-405-C6-410
DOI: 10.1051/jphyscol:1988669
A COMPARISON OF AUTOCORRELOGRAMS DETERMINED FROM SANS AND APFIM DATA
S. SPOONER1 et M.K. MILLER21 Solid State Division, Oak Ridge National Laboratory, Building 5500, PO Box 2008, Oak Ridge, TN 37831-6377, U.S.A.
2 Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831, U.S.A.
Abstract
A comparison has been made of the autocorrelograms obtained from analysis of small angle neutron scattering and atom probe field-ion microscopy data. The two methods were found to be complementary to one another in the interpretation of fine-scaled microstructures. The global character of the spatial structure was given effectively in the SANS autocorrelation function, whereas the small lag autocorrelation values appear to be more accurate in the APFIM results.