| Issue |
J. Phys. Colloques
Volume 49, Number C6, Novembre 1988
35th International Field Emission Symposium / 35éme Symposium International d'Emission de Champ
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|---|---|---|
| Page(s) | C6-113 - C6-118 | |
| DOI | https://doi.org/10.1051/jphyscol:1988619 | |
35th International Field Emission Symposium / 35éme Symposium International d'Emission de Champ
J. Phys. Colloques 49 (1988) C6-113-C6-118
DOI: 10.1051/jphyscol:1988619
1 Sektion Physik, Karl-Marx-Universität, DDR-7010 Leipzig, D.R.G.
2 Institute of Experimental Physics, Wroclaw University, PL-50-205 Wroclaw, Poland
3 On leave from Wroclaw University
J. Phys. Colloques 49 (1988) C6-113-C6-118
DOI: 10.1051/jphyscol:1988619
FIELD EMISSION FLICKER NOISE INDUCED BY SURFACE DIFFUSION FOR W (110) K. TWO PROBED REGIONS TECHNIQUE
J. BEBEN1, 2, 3, Ch. KLEINT1 et R. MECLEWSKI21 Sektion Physik, Karl-Marx-Universität, DDR-7010 Leipzig, D.R.G.
2 Institute of Experimental Physics, Wroclaw University, PL-50-205 Wroclaw, Poland
3 On leave from Wroclaw University
Abstract
In an approach to determine the complete adsorbate mobility induced cross-correlation function (CCF) a new double collector FE tube was realized which is described shortly. The cross-correlation technique was combined with the "slit" technique. CCFs of Field emission current fluctuations were measured in their dependence on distance between the two probed regions on the tungsten (110) plans covered with potassium. The results were obtained for two perpendicular crystallographic directions. As expected from a (standard) diffusion model the CCFs decrease as a whole as well as in their small time delay limit (τ → 0) with increasing probe distance.