| Issue |
J. Phys. Colloques
Volume 49, Number C1, Mars 1988
IAU Colloquium N° 102 on UV and X-ray Spectroscopy of Astrophysical and Laboratory Plasmas
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| Page(s) | C1-303 - C1-303 | |
| DOI | https://doi.org/10.1051/jphyscol:1988163 | |
IAU Colloquium N° 102 on UV and X-ray Spectroscopy of Astrophysical and Laboratory Plasmas
J. Phys. Colloques 49 (1988) C1-303-C1-303
DOI: 10.1051/jphyscol:1988163
PN Lebedev Physical Institute, USSR Academy of Sciences, Leninsky Prospect 53, Moscow 117924, USSR
J. Phys. Colloques 49 (1988) C1-303-C1-303
DOI: 10.1051/jphyscol:1988163
THE USE OF Ti, Si, C, Be AND LiF IN SOFT X-RAY OPTICS
A.V. VINOGRADOVPN Lebedev Physical Institute, USSR Academy of Sciences, Leninsky Prospect 53, Moscow 117924, USSR
Abstract
Ti, Si, C, Be and LiF have been studied as coatings for normal incidence (multilayers) and grazing incidence (steering many-fold reflection mirrors) optical elements. The multilayera have been tested with soft (130+250 Å) and hard (1.54 Å) X-rays. From these measurements the multilayer parameters have been deduced. The carbon and lithium fluorine steering mirrors showed the reflection of 10+60% for the turning angles of 30 and 45 degrees and two wavelengths of 44.7 Å and 67.6 Å. The perspectives of other materials are also discussed.