| Issue |
J. Phys. Colloques
Volume 47, Number C8, Décembre 1986
EXAFS and Near Edge Structure IV
|
|
|---|---|---|
| Page(s) | C8-1045 - C8-1048 | |
| DOI | https://doi.org/10.1051/jphyscol:19868202 | |
EXAFS and Near Edge Structure IV
J. Phys. Colloques 47 (1986) C8-1045-C8-1048
DOI: 10.1051/jphyscol:19868202
1 Siemens AG, ZT MTZ 21, Otto-Hahn-Ring 6, D-8000 München 83. F.R.G
2 Sektion Physik, Universität München, Geschwister-Scholl-Platz 1, D-8000 München 22, F.R.G.
J. Phys. Colloques 47 (1986) C8-1045-C8-1048
DOI: 10.1051/jphyscol:19868202
EXAFS STUDY ON RADIATION INDUCED DEFECTS
T. BOLZE1 et J. PEISL21 Siemens AG, ZT MTZ 21, Otto-Hahn-Ring 6, D-8000 München 83. F.R.G
2 Sektion Physik, Universität München, Geschwister-Scholl-Platz 1, D-8000 München 22, F.R.G.
Without abstract
First page of the article
