| Issue |
J. Phys. Colloques
Volume 47, Number C7, Novembre 1986
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
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| Page(s) | C7-453 - C7-458 | |
| DOI | https://doi.org/10.1051/jphyscol:1986776 | |
33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
J. Phys. Colloques 47 (1986) C7-453-C7-458
DOI: 10.1051/jphyscol:1986776
Institut für angewandte Physik der Universität Tübingen, Auf der Morgenstelle 12, D-7400 Tübingen, F.R.G.
J. Phys. Colloques 47 (1986) C7-453-C7-458
DOI: 10.1051/jphyscol:1986776
MICROPROCESSOR CONTROLLED REMOLDING OF FIELD EMITTERS
F. HASSELBACH, M. NICKLAUS et K. ZEUNERInstitut für angewandte Physik der Universität Tübingen, Auf der Morgenstelle 12, D-7400 Tübingen, F.R.G.
Abstract
A fully automatic, microprocessor controlled remolding system is presented. It has been tested with <100>-oriented tip-shaped tungsten field electron emitters. Many of its features and capabilities would be equally relevant for other types of field electron emitters or in the context of field ion emission. It can produce with high reliability a single spot emission pattern, which is most frequently desired because it normally represents highest brightness. Field emission tips that were in such bad conditions that they would normally have to be replaced could be restored to good emission by the system. Some results on the remolding process itself which were obtained through the use of the remolding system are presented.