| Issue |
J. Phys. Colloques
Volume 42, Number C4, Octobre 1981
Proceedings of the Ninth International Conference on Amorphous and Liquid Semiconductors
|
|
|---|---|---|
| Page(s) | C4-229 - C4-232 | |
| DOI | https://doi.org/10.1051/jphyscol:1981448 | |
Proceedings of the Ninth International Conference on Amorphous and Liquid Semiconductors
J. Phys. Colloques 42 (1981) C4-229-C4-232
DOI: 10.1051/jphyscol:1981448
Department of Physics, University of Leeds, U.K.
J. Phys. Colloques 42 (1981) C4-229-C4-232
DOI: 10.1051/jphyscol:1981448
ON EFFICIENCY OF SCATTERING METHODS TO DETERMINE THE STRUCTURE OF DISORDERED MATERIALS
J. SlechtaDepartment of Physics, University of Leeds, U.K.
Abstract
The sensitivity of the shape of the radial distribution function to model distortions of the shape of the intensity function in scattering experiments is studied in details. It is shown that the radial distribution functions are most sensitive to distortions of the related intensity function between their second and fifth peaks. That indicates that the efficiency of small and large angle scattering experiments to determine the structure of disordered materials is smaller than there is widely assumed. The scattering methods are then compared with different methods of structure determination, like the anomalous Kondo effect, in the case of substitutional binary alloys with statistical short range order.