| Numéro |
J. Phys. Colloques
Volume 48, Numéro C6, Novembre 1987
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
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|---|---|---|
| Page(s) | C6-53 - C6-58 | |
| DOI | https://doi.org/10.1051/jphyscol:1987609 | |
34th International Field Emission Symposium / 34ème Symposium International d'Emission de Champ
J. Phys. Colloques 48 (1987) C6-53-C6-58
DOI: 10.1051/jphyscol:1987609
1 Department of Iron and Steel Engineering, Faculty of Engineering, Nagoya University, Furocho, Chikusaku, Nagoya 464 JAPAN
2 Department of Metallurgy and Materials Science, Faculty of Engineering, The University of Tokyo, Hongo, Bunkyoku, Tokyo 113 Japan
3 Hitachi Central Research Laboratory, Kokubunjishi, Tokyo 185 JAPAN
4 Research and Development Center, Toshiba Corporation, Kawasaki Kanagawa 210
5 Materials Engineering, Tsukuba University, Tennoudai, Ibaragi 305
J. Phys. Colloques 48 (1987) C6-53-C6-58
DOI: 10.1051/jphyscol:1987609
HIGH TEMPERATURE SEQUENCE IMAGES OF FIELD ION MICROSCOPY
M. Doyama1, K. Ishimoto2, T. Nishida3, M. Obara4, Y. Suzuki2 et S. Tanigawa51 Department of Iron and Steel Engineering, Faculty of Engineering, Nagoya University, Furocho, Chikusaku, Nagoya 464 JAPAN
2 Department of Metallurgy and Materials Science, Faculty of Engineering, The University of Tokyo, Hongo, Bunkyoku, Tokyo 113 Japan
3 Hitachi Central Research Laboratory, Kokubunjishi, Tokyo 185 JAPAN
4 Research and Development Center, Toshiba Corporation, Kawasaki Kanagawa 210
5 Materials Engineering, Tsukuba University, Tennoudai, Ibaragi 305
Abstract
Atomistic sequence images of high temperature field ion microscopy are presented for copper and aluminum specimens. A possible mechanism is proposed. The images are formed by the specimen self atoms. These self atoms are ionized when they climb up the atomic steps on the surface.