| Numéro |
J. Phys. Colloques
Volume 46, Numéro C10, Décembre 1985
Eighth International Conference on Internal Friction and Ultrasonic Attenuation in Solids
|
|
|---|---|---|
| Page(s) | C10-813 - C10-816 | |
| DOI | https://doi.org/10.1051/jphyscol:198510178 | |
Eighth International Conference on Internal Friction and Ultrasonic Attenuation in Solids
J. Phys. Colloques 46 (1985) C10-813-C10-816
DOI: 10.1051/jphyscol:198510178
The Institute for Solid State Physics, The University of Tokyo, Roppongi, Minato-ku, Tokyo 106, Japan
J. Phys. Colloques 46 (1985) C10-813-C10-816
DOI: 10.1051/jphyscol:198510178
SURFACE-WAVE RESONANCE METHOD FOR MEASURING SURFACE TENSION WITH A VERY HIGH PRECISION
M. IINO, M. SUZUKI and A.J. IKUSHIMAThe Institute for Solid State Physics, The University of Tokyo, Roppongi, Minato-ku, Tokyo 106, Japan
Abstract
A very precise method for measuring surface tension using the resonance of surface waves on a liquid in a cavity has been developed. The method was then used to measure the surface tension of liquid helium,
3He and 4He , giving an absolute accuracy of about 0.5 mdyne/cm and a sensitivity of 10 µdyne/cm or better. Further possible applications of this method are discussed.