33rd International Field Emission Symposium / 33ème Symposium International d'Emission de Champ
J. Phys. Colloques 47 (1986) C7-211-C7-216
DOI: 10.1051/jphyscol:1986737
AN FIM-ATOM PROBE AND TEM STUDY OF ALNICO PERMANENT MAGNETIC MATERIAL
S.A. COWLEY, M.G. HETHERINGTON, J.P. JAKUBOVICS et G.D.W. SMITHDepartment of Metallurgy and Science of Materials, Parks Road, GB-Oxford 0X1 3PH, Great-Britain
Abstract
Alnico 8 specimens have been studied both in the thermomagnetically aged and further heat treated condition using the field ion microscope (FIM) and high voltage electron microscope. The results are compared with those produced by Hetherington et al., [1] on Alnico 5 and Zhu et al., [2] on Alnico 8.