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Cited article:

On the quality of contacts in a-Si:H staggered electrode thin-film transistors

R.E.I. Schropp, J.W.C. Veltkamp, J. Snijder and J.F. Verwey
IEEE Transactions on Electron Devices 32 (9) 1757 (1985)
https://doi.org/10.1109/T-ED.1985.22192