| Numéro |
J. Phys. Colloques
Volume 50, Numéro C8, Novembre 1989
36th International Field Emission Symposium
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|---|---|---|
| Page(s) | C8-513 - C8-517 | |
| DOI | https://doi.org/10.1051/jphyscol:1989888 | |
36th International Field Emission Symposium
J. Phys. Colloques 50 (1989) C8-513-C8-517
DOI: 10.1051/jphyscol:1989888
The Institute for Solide State Physics, The University of Tokyo, Roppongi, Minato-ku, Tokyo, Japan
J. Phys. Colloques 50 (1989) C8-513-C8-517
DOI: 10.1051/jphyscol:1989888
CONSTRUCTION OF R. T. FI-STMs AND ITS APPLICATIONS
T. HASHIZUME, Y. HASEGAWA, I. KAMIYA, N. SANO, K. YOKOYAMA, H . TANAKA, I. SUMITA, M. TAKAO, S. HYODO et T. SAKURAIThe Institute for Solide State Physics, The University of Tokyo, Roppongi, Minato-ku, Tokyo, Japan
Abstract
Our successful attempt to design and develop series of room-temperature field ion-scanning tunneling microscopies (RT FI-STMs) is discussed. The great advantages of RT FI-STM are (1) almost simultaneous use of both STM mode and FIM mode is possible without wasting machine time and thermal drift, (2) inspection and manipulation of a STM tip in-situ in the STM system can be performed and, thus, each tip can be used over several months with atomic resolution, and (3) a well-characterized tip ensures very high (~100%) success rate in STM imaging with a known resolution. Some examples are given.