| Numéro |
J. Phys. Colloques
Volume 50, Numéro C8, Novembre 1989
36th International Field Emission Symposium
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|---|---|---|
| Page(s) | C8-491 - C8-495 | |
| DOI | https://doi.org/10.1051/jphyscol:1989884 | |
36th International Field Emission Symposium
J. Phys. Colloques 50 (1989) C8-491-C8-495
DOI: 10.1051/jphyscol:1989884
Institute for Solid State Physics, The University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106, Japan
J. Phys. Colloques 50 (1989) C8-491-C8-495
DOI: 10.1051/jphyscol:1989884
DEVELOPMENT OF THE FIELD ION-SCANNING TUNNELING MICROSCOPE AND ITS APPLICATIONS
I. KAMIYA et T. SAKURAIInstitute for Solid State Physics, The University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106, Japan
Abstract
A scanning tunneling microscope (STM) equipped with a field ion microscope (FIM) which operates at room temperature has been constructed and operated successfully to obtain atomically resolved STM images with 100% reproductibility. This instrument, which we call the FI-STM, has been employed for the quantitative study of the Si(100) "2xn" phase.