J. Phys. Colloques
Volume 50, Numéro C8, Novembre 198936th International Field Emission Symposium
|Page(s)||C8-491 - C8-495|
J. Phys. Colloques 50 (1989) C8-491-C8-495
DEVELOPMENT OF THE FIELD ION-SCANNING TUNNELING MICROSCOPE AND ITS APPLICATIONSI. KAMIYA et T. SAKURAI
Institute for Solid State Physics, The University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106, Japan
A scanning tunneling microscope (STM) equipped with a field ion microscope (FIM) which operates at room temperature has been constructed and operated successfully to obtain atomically resolved STM images with 100% reproductibility. This instrument, which we call the FI-STM, has been employed for the quantitative study of the Si(100) "2xn" phase.