| Numéro |
J. Phys. Colloques
Volume 50, Numéro C8, Novembre 1989
36th International Field Emission Symposium
|
|
|---|---|---|
| Page(s) | C8-487 - C8-488 | |
| DOI | https://doi.org/10.1051/jphyscol:1989883 | |
36th International Field Emission Symposium
J. Phys. Colloques 50 (1989) C8-487-C8-488
DOI: 10.1051/jphyscol:1989883
1 Department of Physics, Beijing University, Beijing 100871, P.R. China
2 Department of Radio-Electronics, Beijing University, Beijing 100871, P. R. China
J. Phys. Colloques 50 (1989) C8-487-C8-488
DOI: 10.1051/jphyscol:1989883
DIRECT OBSERVATION OF ATOMIC IMAGE OF HIGH Tc SUPERCONDUCTORS BY FIELD ION MICROSCOPY
Q.J. GAO1, Z.X. ZHANG2, S.Y. XU1, S.Q. FENG1 et S.Z. WANG11 Department of Physics, Beijing University, Beijing 100871, P.R. China
2 Department of Radio-Electronics, Beijing University, Beijing 100871, P. R. China
Abstract
The structure of superconducting Bi2Sr2Ca1Cu2O8 + δ has been examined in atomic detail by field ion microscopy. According to our results we suggest that only the copper end planes are preferentially imaging in superconducting Bi2Sr2Ca1Cu2O8+δ. The atomic image of YBa2Cu3O7-x - covered tungsten tip has also been examined.