| Numéro |
J. Phys. Colloques
Volume 50, Numéro C8, Novembre 1989
36th International Field Emission Symposium
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|---|---|---|
| Page(s) | C8-401 - C8-406 | |
| DOI | https://doi.org/10.1051/jphyscol:1989868 | |
36th International Field Emission Symposium
J. Phys. Colloques 50 (1989) C8-401-C8-406
DOI: 10.1051/jphyscol:1989868
Laboratoire de Microscopie Ionique, URA CNRS 808, BP. 118, F-76134 Mont Saint Aignan Cedex, France
J. Phys. Colloques 50 (1989) C8-401-C8-406
DOI: 10.1051/jphyscol:1989868
ATOM-PROBE STUDY OF SOME FINE-SCALE FEATURES IN NICKEL BASE SUPERALLOYS
A. BUCHON, A. BOSTEL et D. BLAVETTELaboratoire de Microscopie Ionique, URA CNRS 808, BP. 118, F-76134 Mont Saint Aignan Cedex, France
Abstract
A single crystal nickel base superalloy (CMSX-2) has been investigated by means of atom-probe techniques. The relationship between applied heat treatments and the composition of both γ and γ' phases are studied. The role of each precipitation sequence in the standard heat treatment (1050°C/16h + 850°C/48h air cool) is discussed. The high spatial resolution of the atom-probe is used for the investigation of the fine scale concentration fluctuations which may occur in the γ-solid solution. The microanalyses exhibit concentration modulations for chromium ; the wavelength is close to 25 Å. The spatial convolution effects of sine-like fluctuations with the analysis area are discussed.