| Numéro |
J. Phys. Colloques
Volume 50, Numéro C7, Octobre 1989
X-ray and Neutron Scattering from Surfaces and Thin FilmsProceedings of the International Conference on Surface and Thin Film studies using Glancing-Incidence X-ray and Neutron Scattering |
|
|---|---|---|
| Page(s) | C7-99 - C7-106 | |
| DOI | https://doi.org/10.1051/jphyscol:1989709 | |
X-ray and Neutron Scattering from Surfaces and Thin Films
Proceedings of the International Conference on Surface and Thin Film studies using Glancing-Incidence X-ray and Neutron Scattering
J. Phys. Colloques 50 (1989) C7-99-C7-106
DOI: 10.1051/jphyscol:1989709
Neutron Science Division, Rutherford Appleton Laboratory, Chilton, Didcot, GB-Oxon OX11 0QX, Great-Britain
Proceedings of the International Conference on Surface and Thin Film studies using Glancing-Incidence X-ray and Neutron Scattering
J. Phys. Colloques 50 (1989) C7-99-C7-106
DOI: 10.1051/jphyscol:1989709
SURFACE REFLECTION STUDIES AT ISIS ON THE REFLECTOMETER, CRISP
J. PENFOLDNeutron Science Division, Rutherford Appleton Laboratory, Chilton, Didcot, GB-Oxon OX11 0QX, Great-Britain
Abstract
The surface reflectometer, CRISP, on the ISIS pulsed neutron source is described. Recent developments in the analysis of reflectivity profiles is discussed. Some recent examples of the application of the technique from the extensive scientific programme in surface chemistry, surface magnetism and solid films are presented.
Résumé
On décrit le réflectomètre de surface, CRISP installé sur la source de neutrons pulsés ISIS et l'on discute les développements récents dans l'analyse des profils de réflectivité. On présente également quelques exemples récents de l'application de cette technique à des programmes scientifiques importants en chimie de surface, magnétisme de surface et dans l'étude des couches minces.