J. Phys. Colloques
Volume 49, Numéro C8, Décembre 1988Proceedings of the International Conference on Magnetism
|Page(s)||C8-2003 - C8-2004|
J. Phys. Colloques 49 (1988) C8-2003-C8-2004
MAGNETIC AND STRUCTURAL CHARACTERIZATION OF CoNiCr THIN FILM MEDIAS. L. Duan, K. R. Mountfield, J. O. Artman, J.-W. Lee, B. Wong et D. E. Laughlin
Magnetic Materials Research Group, Carnegie Mellon University, Pittsburgh, PA, 15213-3890, U.S.A.
Thin Co62.5Ni30Cr7.5 films were rf-sputtered onto glass and Cr/glass. Magnetic anisotropy, coercivity and magnetization were compared with inferences from structural characterization. For CoNiCr/glass narrow FMR line widths ƊH, low coercivity Hc and effective anisotropy field Hkeff values close to 4πMs were observed. For CoNiCr/Cr/glass broader ƊH, larger Hc and Hkeff deviating from 4πMs were observed. Crystal texture and grain growth depended on the presence/absence of a Cr underlayer.