Numéro
J. Phys. Colloques
Volume 49, Numéro C8, Décembre 1988
Proceedings of the International Conference on Magnetism
Page(s) C8-1749 - C8-1750
DOI https://doi.org/10.1051/jphyscol:19888796
Proceedings of the International Conference on Magnetism

J. Phys. Colloques 49 (1988) C8-1749-C8-1750

DOI: 10.1051/jphyscol:19888796

STRUCTURE PROFILE OF B+ ION IMPLANTED IRON FILM

Yue-Lu Zhang, Si-Yun Bi, Liang-Mo Mei et Zhen-Huan Lei

Department of Physics, Shandong University, Jinan, China


Abstract
The profile of microscopic structure of a polycrystalline iron film implanted by boron ions has been investigated using 57Fe conversion electron Mössbauer spectroscopy (CEMS) with ion beam etching technique. Parameters of CEMS show minima or maxima in the middle of the implanted layer.