| Numéro |
J. Phys. Colloques
Volume 49, Numéro C6, Novembre 1988
35th International Field Emission Symposium / 35éme Symposium International d'Emission de Champ
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|---|---|---|
| Page(s) | C6-433 - C6-438 | |
| DOI | https://doi.org/10.1051/jphyscol:1988674 | |
35th International Field Emission Symposium / 35éme Symposium International d'Emission de Champ
J. Phys. Colloques 49 (1988) C6-433-C6-438
DOI: 10.1051/jphyscol:1988674
1 Laboratoire de Microscopie Ionique, CNRS UA-808, Faculté des Sciences de Rouen, BP 118, F-76134 Mont-Saint-Aignan Cedex, France
2 Equipe de Probabilités et Statistiques, Faculté des Sciences de Rouen, BP 118, F-76134 Mont-Saint-Aignan Cedex, France
J. Phys. Colloques 49 (1988) C6-433-C6-438
DOI: 10.1051/jphyscol:1988674
STATISTICAL ANALYSIS OF ATOM-PROBE DATA (I) : DERIVATION OF SOME FINE-SCALE FEATURES FROM FREQUENCY DISTRIBUTIONS FOR FINELY DISPERSED SYSTEMS
D. BLAVETTE1, G. GRANCHER2 et A. BOSTEL11 Laboratoire de Microscopie Ionique, CNRS UA-808, Faculté des Sciences de Rouen, BP 118, F-76134 Mont-Saint-Aignan Cedex, France
2 Equipe de Probabilités et Statistiques, Faculté des Sciences de Rouen, BP 118, F-76134 Mont-Saint-Aignan Cedex, France
Abstract
A statistical model has been developed in order to predict the concentration histograms which are used in atom-probe analyses. This method allows theoretical distributions to be calculated for finely dispersed systems containing spherical particles. Some statistical methods are proposed for the interpretation of experimental histograms.