| Numéro |
J. Phys. Colloques
Volume 49, Numéro C6, Novembre 1988
35th International Field Emission Symposium / 35éme Symposium International d'Emission de Champ
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| Page(s) | C6-43 - C6-48 | |
| DOI | https://doi.org/10.1051/jphyscol:1988608 | |
35th International Field Emission Symposium / 35éme Symposium International d'Emission de Champ
J. Phys. Colloques 49 (1988) C6-43-C6-48
DOI: 10.1051/jphyscol:1988608
Gorlaeus Laboratories, PO Box 9502, NL-2300 RA Leiden, The Netherlands
J. Phys. Colloques 49 (1988) C6-43-C6-48
DOI: 10.1051/jphyscol:1988608
A COMPUTER CONTROLLED SCANNING PROBE-HOLE FIELD EMISSION MICROSCOPE
R.M. WOLF, J.W. BAKKER et B.E. NIEUWENHUYSGorlaeus Laboratories, PO Box 9502, NL-2300 RA Leiden, The Netherlands
Abstract
A microprocessor controlled Field Emission Microscope is presented. It is capable of measuring changes in work function on different single crystal surfaces present on a field emission tip. During experiments the tip temperature can be measured with an accuracy of 1K. The field emission set up was tested with a series of experiments in which hydrogen was desorbed from a few selected rhodium surfaces.