| Numéro |
J. Phys. Colloques
Volume 49, Numéro C5, Octobre 1988
Interface Science and Engineering '87An International Conference on the Structure and Properties of Internal Interfaces |
|
|---|---|---|
| Page(s) | C5-233 - C5-238 | |
| DOI | https://doi.org/10.1051/jphyscol:1988525 | |
Interface Science and Engineering '87
An International Conference on the Structure and Properties of Internal Interfaces
J. Phys. Colloques 49 (1988) C5-233-C5-238
DOI: 10.1051/jphyscol:1988525
1 Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaften, Seestrasse 92, D-7000 Stuttgart 1, F.R.G.
2 Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, U.S.A.
An International Conference on the Structure and Properties of Internal Interfaces
J. Phys. Colloques 49 (1988) C5-233-C5-238
DOI: 10.1051/jphyscol:1988525
SOME PRESENT LIMITATIONS ON THE LATTICE IMAGING OF GRAIN BOUNDARIES
W. MADER1, G. NECKER1 et R.W. BALLUFFI21 Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaften, Seestrasse 92, D-7000 Stuttgart 1, F.R.G.
2 Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139, U.S.A.
Abstract
Limitations which currently exist on using the electron microscope lattice imaging technique to obtain information about grain boundary structure are considered. Boundaries are only amenable when the adjoining crystals are oriented so that they produce projected patterns of resolved atomic columns or atomic planes. The conditions under which information can then be obtained about the atomistic core structure, the boundary translational state and the presence of localized grain boundary dislocations are described. In a number of instances, ultra-thin bicrystals are required which are so thin that great difficulties will be encountered with utilizing them on a practical basis.