Numéro
J. Phys. Colloques
Volume 49, Numéro C5, Octobre 1988
Interface Science and Engineering '87
An International Conference on the Structure and Properties of Internal Interfaces
Page(s) C5-207 - C5-212
DOI https://doi.org/10.1051/jphyscol:1988521
Interface Science and Engineering '87
An International Conference on the Structure and Properties of Internal Interfaces

J. Phys. Colloques 49 (1988) C5-207-C5-212

DOI: 10.1051/jphyscol:1988521

EXTENDED CSL-MODEL FOR GRAIN BOUNDARY IN LAYER STRUCTURES

Y. KITANO, M. TAKATA et Y. KOMURA

Department of Materials Science, Faculty of Science, Hiroshima University, Higashi-senda-machi, Naka-ku, Hiroshima 730, Japan


Abstract
The extended CSL-model is applied to structure analysis of boundaries which are observed in high resolution electron microscope (HREM) images between two crystals with two different layer structures. An HREM image for the twist boundary is presented and the CSL-pattern which is predicted by this extension is confirmed. A modification of the Σ-values due to this extension is discussed.