Numéro |
J. Phys. Colloques
Volume 49, Numéro C5, Octobre 1988
Interface Science and Engineering '87An International Conference on the Structure and Properties of Internal Interfaces |
|
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Page(s) | C5-183 - C5-188 | |
DOI | https://doi.org/10.1051/jphyscol:1988517 |
Interface Science and Engineering '87
An International Conference on the Structure and Properties of Internal Interfaces
J. Phys. Colloques 49 (1988) C5-183-C5-188
DOI: 10.1051/jphyscol:1988517
Institute of Industrial Science, University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106, Japan
An International Conference on the Structure and Properties of Internal Interfaces
J. Phys. Colloques 49 (1988) C5-183-C5-188
DOI: 10.1051/jphyscol:1988517
HIGH RESOLUTION ELECTRON MICROSCOPY OF INTERFACES IN FUNCTIONAL MATERIALS
Y. ISHIDA, H. ICHINOSE et Y. TAKAHASHIInstitute of Industrial Science, University of Tokyo, 7-22-1 Roppongi, Minato-ku, Tokyo 106, Japan
Abstract
Our recent high resolution electron microsocpic observation of various interfaces in functional materials such as semiconductor superlattice, superconducting perovskite ceramic, new engineering ceramics, fibre reinforced metal and ceramic-metal joining suggested that the traditional unified view of the interface structure in a number of directions taking into account the chemistry, polytype structures, thickness, bonding heterogenity etc to make the structural theory useful for the future design of the interfaces in modern functional materials.