Numéro |
J. Phys. Colloques
Volume 49, Numéro C5, Octobre 1988
Interface Science and Engineering '87An International Conference on the Structure and Properties of Internal Interfaces |
|
---|---|---|
Page(s) | C5-71 - C5-85 | |
DOI | https://doi.org/10.1051/jphyscol:1988506 |
An International Conference on the Structure and Properties of Internal Interfaces
J. Phys. Colloques 49 (1988) C5-71-C5-85
DOI: 10.1051/jphyscol:1988506
X-RAY DIFFRACTION STUDIES OF THE STRUCTURE AND PROPERTIES OF GRAIN BOUNDARIES
M.R. FITZSIMMONS et S.L. SASSDepartment of Materials Science and Engineering, Cornell University, Ithaca, NY 14853-1501, U.S.A.
Abstract
Quantitative X-ray diffraction techniques have been used to study the atomic structure and thermal properties of large angle [001] twist boundaries in Au. The reciprocal lattice of the Σ = 5 boundary was mapped out using synchrotron radiation. The atomic structure of this boundary was obtained by finding the best fit to the intensity observations using a chi square analysis. The boundary structure was shown to consist of arrays of two kinds of distorted octahedra and special configurations of distorted tetrahedra interwoven together by the boundary symmetry. The Debye-Waller factor of the grain boundary (and the magnitude of the atomic displacements due to thermal motion) in the plane of the interface was determined from integrated intensity measurements as a function of temperature.